Abstract: A system and method provides accurate time generation in a computing device that includes a computing device clock and a microprocessor. The method includes determining a total system latency based on a delay incurred between issuance of a first command by the microprocessor and receipt of a first time-data signal by the microprocessor. The first time-data signal is representative of a master clock output of a master clock device at a first time. The method also includes deriving an accurate time from a second time-data signal. The second time-data signal is representative of the master clock output at a second time known by the microprocessor. The method further includes adjusting the accurate time based on a percentage of the total system latency to form a latency adjusted time, and applying the latency adjusted time to the computing device clock to synchronize the computing device clock to the master clock output.

Abstract: Provided is an apparatus and method for providing differential protection for a phase angle regulating transformer having a load side and a source side in a three-phase power system. The method includes calculating a first positive sequence component and a first negative sequence component associated with incoming secondary currents detected on the source side, calculating a second positive sequence component and a second negative sequence component associated with outgoing secondary currents detected on the load side, applying a phase angle shift to the second positive sequence component and the second negative sequence component to form a compensated positive sequence component and a compensated negative sequence component, respectively, and determining an operate current value and a restraint current value for each of a positive and negative sequence differential element of the differential protection based on the compensated positive sequence component and the compensated negative sequence component.

Abstract: A manufacturer determines a maximum ambient temperature for an electronic device to be manufactured. The device has a data processor equipped with a utilization monitor. A test unit of the device is manufactured and placed under test at the maximum ambient temperature. The manufacturer during this test stage runs the application software for the electronic device at this time, in the test state. The temperature of the processor and its utilization reading are observed If the processor temperature increases out of range, then the software should be changed to utilize less processing capacity of the processor. A suitable reduction or adjustment in the software is determined, and the utilization amount is stored in memory. The electronic device is constructed with the alert circuitry and process. Hence, if the user should task the processor beyond the predetermined limit, the electronic device communicates that to the user.