Abstract: Disclosed is a pollution measurement apparatus which measures a pollutant concentration and a pollutant component in gas, and more particularly a pollution measurement apparatus for easily exchanging a sensor, which can facilely exchange only desired sensors when it is required to exchange part of multiple sensors for sensing pollution.
Type:
Grant
Filed:
October 5, 2012
Date of Patent:
April 21, 2015
Assignee:
Scientec Lab Center Co., Ltd.
Inventors:
Ik-Jae Lee, Han-Soo Kim, Chang-Ik Kang, Ji-Sun Kim, Sun-Tae Kim
Abstract: Disclosed is a pollution measurement apparatus which measures a pollutant concentration and a pollutant component in gas, and more particularly a pollution measurement apparatus for easily exchanging a sensor, which can facilely exchange only desired sensors when it is required to exchange part of multiple sensors for sensing pollution.
Abstract: There are disclosed a method for managing a pollution prevention facility and a system for effectively managing the pollution prevention facility which can exhaust pollutants, and a system thereof. A method for managing a pollution prevention facility includes a first measuring step of measuring pollutants before a pollution prevention facility treats a pollutant outlet; a second measuring step of measuring the amount of pollutants after the pollution prevention facility treats the pollutant outlet; and a managing step of managing an exchange period of a filling material provided in the pollution prevention facility.
Type:
Application
Filed:
December 3, 2009
Publication date:
May 17, 2012
Applicant:
SCIENTEC LAB CENTER CO., LTD.
Inventors:
II Hwan Choi, Han Soo Kim, Sun Tae Kim, Ik Jae Lee