Patents Assigned to Scientific Measurement Systems, Inc.
  • Patent number: 5400381
    Abstract: A process for analyzing the contents of containers comprising obtaining a first image of the container, tilting the container, obtaining a second image of the contents of the container in the tilted position, overlaying the first and second images, and subtracting one image from the other so that contents that remain horizontal are identified and objects that tilt are substantially erased from view in the final differenced image. In one method, the container is manually or mechanically moved relative to the image taking device, such as a digital radiography device. In another method, in order to avoid parallax problems, the container and image taking device are moved together. Computed tomography can be used in combination to obtain more characterization of the contents including shapes, densities, atomic numbers, wall thicknesses, and the like.
    Type: Grant
    Filed: May 6, 1993
    Date of Patent: March 21, 1995
    Assignee: Scientific Measurement Systems, Inc.
    Inventors: John S. Steude, Edwin L. Strickland, III
  • Patent number: 5351203
    Abstract: The present invention relates to a computer tomography system which measures the thickness and edge position of hot-rolled steel. X-rays produced by two X-ray sources are directed, through the sample being measured, to a plurality of radiation detectors. The radiation detectors measure the attenuation of the X-rays caused by the sample. The attenuation levels sensed by each detector are correlated with each detector's physical location. This information is collected as each X-ray source illuminates the radiation detectors. The collected information is triangulated or averaged, as necessary, to determine the dimensions and position of the measured sample.
    Type: Grant
    Filed: August 3, 1992
    Date of Patent: September 27, 1994
    Assignees: Bethlehem Steel Corporation, Scientific Measurement Systems, Inc.
    Inventors: Carvel D. Hoffman, Charles J. Romberger, Hunter Ellinger, Thomas W. Stephens, Richard D. Savage
  • Patent number: 4437006
    Abstract: An apparatus for determining the intensity of radiation passing through an object as a set of planar beams from a radiation source is disclosed. The radiographic apparatus includes a detector array of adjoining scintillators having wall linings suitable for absorbing radiation, thereby functioning as self-colliminating detectors. The apparatus is also capable of counting the number of individual photons of primary radiation passing through an object along each path from a radiation source operating at the very high count rates used in computer-assisted tomography applications.
    Type: Grant
    Filed: May 5, 1981
    Date of Patent: March 13, 1984
    Assignee: Scientific Measurement Systems, Inc.
    Inventors: Ira L. Morgan, E. C. George Sudarshan, Alvin L. Mitchell, James P. Coose, Hunter D. Ellinger, James W. Jagger