Abstract: A process for depositing a layer on at least part of the surface of a substrate by at least partially submerging the substrate in a solution having a solvent and at least one compound intended to form the layer, then drying the substrate, the drying being at least partially carried out in an atmosphere that is isolated from the solution. The submersion in the solution and the drying of the substrate are carried out in the same controlled-atmosphere enclosure.

Abstract: The present invention relates to a method and a device for direct, non-deformed one-shot measurement of the transient birefringence induced in an optical medium by a perturbation lying within the terahertz frequency range. The aim of the present invention is to alleviate the drawbacks of the prior art by providing a one-shot measurement method and a one-shot measurement device, these being based on the spectral encoding/decoding principle, which are compatible with all short pulse (UV-NIR) laser sources. In this regard, the invention provides a one-shot method for measuring the transient birefringence induced in an optical medium (12) by at least one terahertz perturbation (6), the method including a step of transmitting and spectrally encoding a pulsed optical signal (2).