Patents Assigned to Security Matters Ltd.
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Patent number: 11508195Abstract: The present invention relates to an access control system, an access object and a method for access control. The access control system comprises an access request receiving device being configured and operable for receiving an access object; the access request receiving device comprising an emitter configured and operable for irradiating the access object with a radiation having a wavelength in the range of about 10?12 and 10?9 m and a detector configured and operable for detecting a response signal from the irradiated access object; a control circuit being configured and operable to receive the response signal from the access request receiving device and process the response signal to identify spectral features indicative of an XRF signature of the access object; wherein the control circuit is adapted to generate an unlocking signal for switching a module device between a locked state and an unlocked state upon identification of the XRF signature.Type: GrantFiled: March 21, 2017Date of Patent: November 22, 2022Assignees: Soreq Nuclear Research Center, Security Matters Ltd.Inventors: Yair Grof, Tzemah Kislev, Nadav Yoran, Haggai Alon
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Publication number: 20220317069Abstract: A method and system are provided for model-based analysis of samples of interest and management of sample classification. Predetermined modeled data is provided including data indicative of K models for respective K measurement schemes based on a predetermined function having a spectral line shape, data indicative of M characteristic vectors of M predetermined group to which different samples relate, and data indicative of a common vector of weights for the M groups. A data processor utilizes the data and operates to apply model-based processing to measured spectral data of a sample of interest using the predetermined modeled data, and generate classification data indicative of relation of the specific sample of interest to one of the M predetermined groups.Type: ApplicationFiled: April 5, 2020Publication date: October 6, 2022Applicant: SECURITY MATTERS LTD.Inventors: Yair GROF, Dmitrijs DOCENKO, Mirit KAGARLITSKY, Nataly TAL, Nadav YORAN, Haggai ALON
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Patent number: 11446951Abstract: Provided is an anti-counterfeit marking technique for verifying authenticity of objects using x-ray fluorescence (XRF) analysis.Type: GrantFiled: February 2, 2017Date of Patent: September 20, 2022Assignees: SOREQ NUCLEAR RESEARCH CENTER, SECURITY MATTERS LTD.Inventors: Yair Grof, Tzemah Kislev, Nadav Yoran, Yaara Bondy, Haggai Alon
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Patent number: 11320384Abstract: Method and systems are presented for authentication of precious stones, according to their natural ID and/or predetermined markings created in the stones, based on unique characteristic radiation response of the stone to predetermined primary radiation.Type: GrantFiled: August 29, 2017Date of Patent: May 3, 2022Assignees: SOREQ NUCLEAR RESEARCH CENTER, SECURITY MATTERS LTD., YAHIOMA TECHNOLOGIES INC.Inventors: Yair Grof, Tzemah Kislev, Nadav Yoran, Haggai Alon, Mor Kaplinsky
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Patent number: 11221305Abstract: Systems and methods for marking of objects, such as keys/key-blanks, in a production line are disclosed. The objects are marked by applying a marking composition(s) to pre-selected areas on the surface thereof. The system includes a marking unit for dispensing a volume of marking composition in one or more localized pre-selected areas on the surface of an object to be marked; a holder/gripper for positioning the object to be marked in one or more positions relative to the marking unit so as to allow the marking unit to dispense the marking composition on the one or more pre-selected localized areas; a reading/verification unit for detecting the marking composition applied to the object thereby verifying that the objects are properly marked; an orientation sensing unit for identifying the orientation of the object to be marked relatively to the holder. The system also includes a controller configured for controlling the operation of the holder, orientation sensing unit, and the marking unit.Type: GrantFiled: May 15, 2018Date of Patent: January 11, 2022Assignee: SECURITY MATTERS LTD.Inventors: Yaakov Gridish, Tzemah Kislev, Haggai Alon, Nadav Yoran, Mor Kaplinsky, Avital Trachtman
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Patent number: 11193007Abstract: The invention provides formulations and masterbatches of a polymeric material and XRF-identifiable markers, for producing transparent elements including a polymer and at least one XRF-identifiable marker for a variety of industrial uses.Type: GrantFiled: October 1, 2017Date of Patent: December 7, 2021Assignees: Security Matters Ltd., SOREQ NUCLEAR RESEARCH CENTERInventors: Nadav Yoran, Tzemah Kislev, Yair Grof, Haggai Alon, Mor Kaplinsky
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Publication number: 20210321649Abstract: Provided is a method for marking a product for human or animal use with an XRF identifiable mark, the method including forming on at least a region of the product a pattern of at least one FDA-grade material identifiable by XRF, the pattern being optionally at least partially invisible to the naked human eye and having a predefined identifiable characteristic, wherein the product is selected from food products, therapeutics and cosmetics.Type: ApplicationFiled: September 25, 2017Publication date: October 21, 2021Applicants: SECURITY MATTERS LTD., SOREQ NUCLEAR RESEARCH CENTERInventors: Nadav YORAN, Tzemah KISLEV, Yair GROF, Haggai ALON, Mor KAPLINSKY
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Patent number: 11112372Abstract: A control system and method are presented for controlling operation of an X-ray Fluorescent (XRF) system for detecting at least one material carried by a sample, for example at least one marker carried by the sample. The control system comprises: data input utility for receiving input data comprising material/marker related data about said at least one material/marker; and data processor and analyzer utility. The data processor and analyzer utility is configured and operable for analyzing the input data and determining optimal geometrical characteristics of the XRF system for optimizing operational conditions of said XRF system to maximize amount of primary X-ray radiation that reaches a predetermined region of the sample and is absorbed by a volume of said region and to maximize a portion of secondary radiation emitted from said region that reaches a detector of the XRF system; and for generating operational data to the XRF system enabling adjustment of the geometrical characteristics of the XRF system.Type: GrantFiled: September 17, 2017Date of Patent: September 7, 2021Assignees: SOREQ NUCLEAR RESEARCH CENTER, SECURITY MATTERS LTD.Inventors: Yair Grof, Tzemah Kislev, Nadav Yoran, Haggai Alon, Mor Kaplinsky
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Publication number: 20210178802Abstract: The present invention provides an anti-counterfeit marking technique for verifying authenticity of objects using x-ray fluorescence (XRF) analysis.Type: ApplicationFiled: February 2, 2017Publication date: June 17, 2021Applicants: SECURITY MATTERS LTD., SOREQ NUCLEAR RESEARCH CENTERInventors: Yair GROF, Tzemah KISLEV, Nadav YORAN, Yaara BONDY, Haggai ALON
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Patent number: 11029267Abstract: There are disclosed a method of producing an XRF readable mark, the XRF readable mark and a component comprising thereof. The method comprises providing an XRF marking composition with specific relative concentrations of one or more chemical elements and fabricating a multilayer structure of the XRF readable mark. The relative concentrations are selected such that in response to irradiation of the XRF marking composition by XRF exciting radiation, the XRF marking composition emits an XRF signal indicative of a predetermined XRF signature. Fabricating the multilayer structure comprises implementing an attenuation layer with at least one element exhibiting high absorbance for an XRF exciting radiation and/or an XRF background; and implementing a marking layer comprising said XRF marking composition.Type: GrantFiled: March 30, 2020Date of Patent: June 8, 2021Assignee: Security Matters Ltd.Inventors: Nataly Tal, Mor Kaplinsky, Tehila Nahum, Hagit Sade, Dana Gasper, Ron Dafni, Chen Nachmias, Michal Firstenberg, Avital Trachtman, Haggai Alon, Nadav Yoran, Tzemah Kislev
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Patent number: 10969351Abstract: In a method and a system for authenticating an object marked with XRF marking, a wavelength spectral profile is provided of a detected portion of an X-Ray signal arriving from an object in response to X-Ray or Gamma-Ray radiation applied to the object and the wavelength spectral profile is filtered to suppress trend and periodic components from the wavelength spectral profile to obtain a filtered profile with improved signal to noise or signal to clutter ratio. The object can be authenticated by processing the filtered profile and identifying one or more peaks therein, which satisfy a predetermined condition, whereby the wavelengths of the identified peaks are indicative of the signatures of materials included in the object.Type: GrantFiled: December 10, 2019Date of Patent: April 6, 2021Assignees: SOREQ NUCLEAR RESEARCH CENTER, SECURITY MATTERS LTD.Inventor: Yair Grof
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Patent number: 10967404Abstract: The present invention discloses a novel XRF analyzer capable of simultaneously identifying the presence of a marking composition in a plurality of objects by modulating/varying the intensity of the excitation beam on the different objects and measuring the secondary radiation thereof.Type: GrantFiled: June 21, 2017Date of Patent: April 6, 2021Assignees: SOREQ NUCLEAR RESEARCH CENTER, SECURITY MATTERS LTD.Inventors: Yair Grof, Tzemah Kislev, Nadav Yoran, Haggai Alon, Mor Kaplinsky
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Patent number: 10607049Abstract: Methods and systems for verifying compatibility of components of an electronic system are disclosed. The method includes irradiating a first and second components presumably associated with the electronic system, with XRF exciting radiation, and in response thereto, detecting one or more XRF response signals indicative of first and second XRF signatures, emitted from the first and second components. Then the first and second XRF signatures are processed to determine whether they are associated with respectively a first and second XRF marking compositions on the first and second components, and the compatibility of the first and second components to the electronic system is determined/verified based on the correspondence between the first and a second XRF signatures. Electronic systems are also disclosed including at least a first and a second electronic components respectively having the first and second XRF marking compositions that enable verification of compatibility of the components.Type: GrantFiled: April 4, 2017Date of Patent: March 31, 2020Assignees: SOREQ NUCLEAR RESEARCH CENTER, SECURITY MATTERS LTD.Inventors: Yair Grof, Tzemah Kislev, Nadav Yoran, Haggai Alon
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Patent number: 10539521Abstract: In a method and a system for authenticating an object marked with XRF marking, a wavelength spectral profile is provided of a detected portion of an X-Ray signal arriving from an object in response to X-Ray or Gamma-Ray radiation applied to the object and the wavelength spectral profile is filtered to suppress trend and periodic components from the wavelength spectral profile to obtain a filtered profile with improved signal to noise or signal to clutter ratio. The object can be authenticated by processing the filtered profile and identifying one or more peaks therein, which satisfy a predetermined condition, whereby the wavelengths of the identified peaks are indicative of the signatures of materials included in the object.Type: GrantFiled: March 31, 2016Date of Patent: January 21, 2020Assignees: SOREQ NUCLEAR RESEARCH CENTER, SECURITY MATTERS LTD.Inventor: Yair Grof
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Publication number: 20190156075Abstract: Methods and systems for verifying compatibility of components (e.g. parts or devices) of an electronic system are disclosed. In certain embodiments the method includes: irradiating a first and second components presumably associated with the electronic system, with XRF exciting radiation, and detecting one or more XRF response signals indicative of a first and a second XRF signatures, emitted from the first and second components in response to the irradiation. Then the first and second XRF signatures are processed to determine whether they are associated with respectively a first and second XRF marking compositions on the first and second components, and the compatibility of the first and second components to the electronic system is determined/verified based on the correspondence between the first and a second XRF signatures/marking.Type: ApplicationFiled: April 4, 2017Publication date: May 23, 2019Applicants: Soreq Nuclear Research Center, Security Matters Ltd.Inventors: Yair GROF, Tzemah KISLEV, Nadav YORAN, Haggai ALON