Abstract: A fiber optic module housing (10) has a plurality of module seats (12a) for receipt of fiber optic modules (16) having a connector portion extending through a connector opening (12b) of a front wall of the housing. A pressure bar (14i) is integrally connected to the cover (14) through hinges (14h) and is movable to depress a locking arm (16b) of the connectors. A hole (12h) is provided in the back wall of base (12) in alignment with each module seat for a straight test configuration and posts (12j) are provided in a recess (12d) of the base for a loop test configuration. In one embodiment the connector openings are aligned in a straight line and in another they are aligned in a stepped configuration.

Abstract: A mounting device (10) is shown particularly adapted for adjustably mounting vectorless test heads for circuit board components and the like to be tested for processing faults of component pin connections with traces of a circuit board in which the components are mounted. A U-shaped bracket (18) is lockably received on a rail (2) and has first and second projections (18d,18e) slidably received through a respective slot (16c,16d) of a leg (16) of a T-shaped member (12). The base leg (14) of the T-shaped member (12) is connected to one end of a pin member (24) which slides through a bore (18p) in one arm (18b) of U-shaped bracket (18) and is threadingly received in a threaded bore (18n) of the other arm (18a) of the U-shaped bracket (18). Rotational movement of the pin member (24) causes T-shaped member (12) to move in a Z direction to permit precise locating of a test head (30) mounted on the base leg (14).

Abstract: A test fixture (10) for mounting electrical circuit boards (CB, CB') and placing a plurality of test locations of the circuit board in electrical engagement with respective probe test pins (16) of an array of such pins has a cam mechanism (22) mounted in an integrally formed modular frame (20) of an upper assembly (12). The upper assembly (12) is pivotably mounted on a lower base assembly (14) and latched thereto by a latch assembly (28). A circuit board to be tested is placed over an array of longitudinally depressable pins (16), the upper assembly (28) pivoted to a closed position and latched by latch mechanism (28). Handle (22k) attached to the cam assembly (22) is then rotated causing blocks (22f) to slide in rectilinear track (22e) of slide plate (22c) while translating rotary motion of the cams members (22g) to a vertical motion of a pusher plate (30) attached to the slide plates (22c).