Abstract: A substrate inspection apparatus inspecting substrates using a vision system, which includes a camera module and an illumination module, and a substrate treatment system including the substrate inspection apparatus are provided. The substrate treatment system includes: a first substrate treatment apparatus; a second substrate treatment apparatus; a transfer unit transporting a container with a plurality of substrates accommodated therein from the first substrate treatment apparatus to the second substrate treatment apparatus; and a substrate inspection apparatus inspecting the substrates, wherein the substrate inspection apparatus includes an illumination module, which illuminates in a direction where the substrates are located, a camera module, which acquires images related to the substrates when the substrates are illuminated, and a control module, which inspects the substrates based on the images.
Type:
Grant
Filed:
October 19, 2023
Date of Patent:
August 26, 2025
Assignee:
SEMES C0., LTD.
Inventors:
Jeong Hoon Han, Oh Yeol Kwon, Jun Hyun Lim, Dong Min Park
Abstract: A support structure, includes: a support plate supporting a substrate; a lower cover covering a lower portion of the support plate; and a catching unit comprising a concave-convex structure having portions corresponding to each other so that the support plate and the lower cover are rotated and assembled with each other.
Type:
Grant
Filed:
February 6, 2023
Date of Patent:
August 19, 2025
Assignee:
SEMES C0., LTD.
Inventors:
Jae Hun Jeong, Cheol Yong Shin, Wan Hee Jeong, Do Youn Lim