Patents Assigned to Semiconductor Insights, Inc.
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Patent number: 8606041Abstract: A schematic diagram detailing a circuit that was reverse engineered from a plurality of images taken of the circuit is provided. The schematic diagram includes at least one circuit element that was represented as an object in at least one of the plurality of images, such that signal continuity information was determined through local tracing of connectivity between a first image and a second image of the plurality of images. A method of tracing the connectivity within the plurality of images to produce the schematic diagram is also disclosed.Type: GrantFiled: February 11, 2008Date of Patent: December 10, 2013Assignee: Semiconductor Insights, Inc.Inventors: Edward Keyes, Vyacheslav L. Zavadsky
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Patent number: 8122053Abstract: A method of normalizing a bibliographic field of a structured field relational database is disclosed. The method includes weighting potential candidate records according to the value in the corresponding field in the records, together with other related fields in the candidate record and other related records in the database. Each of the candidate records is successively evaluated and compared against an acceptable threshold. If the weight exceeds the threshold, the candidate record is returned from the query. Otherwise, a new entry in the database is created. Optionally, before creating such a new entry, the highest weighted candidate record may be compared against a minimally acceptable threshold and if the weight exceeds such a lower threshold, the candidate is returned from the query.Type: GrantFiled: January 7, 2008Date of Patent: February 21, 2012Assignee: Semiconductor Insights, Inc.Inventor: Jason M. White
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Patent number: 7886258Abstract: A method and apparatus to reduce occurrences of electrically non-functional elements, known as dummy features, from a source data structure is described. The source data structure may be image data, a vector based data structure or some other data format. Dummy features in the source data structure are detected and then deleted. Dummy features may be detected by selecting a representative dummy feature, using it as a reference pattern or polygon and comparing it to features in the source data structure. The step of comparing the selected reference to the comprises selecting a cut-off correlation threshold value, and computing the correlation coefficients between the reference and the feature. Features are selectively removed based on a comparison between their correlation coefficients and the selected cut-off correlation threshold value. This threshold value may require updating to remove all dummy features in the source data structure.Type: GrantFiled: June 15, 2010Date of Patent: February 8, 2011Assignee: Semiconductor Insights, Inc.Inventors: Mohammed Ouali, Jason Abt, Edward Keyes, Vyacheslav Zavadsky
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Publication number: 20090228518Abstract: A method and system for organizing and managing claim elements and reference objects is disclosed. The method and system establish database links between claim elements and reference objects based on associations identified between them. These database links are then stored in the database for future reference. The links are also used to derive additional associations between other claim elements and reference objects. The method and the system also enable the displaying of claim elements and reference objects to users in a way that illustrates the associations between the claim elements and reference objects. Associations may be defined based on similarities or dissimilarities between claim elements and reference objects, and amongst claim elements and reference objects, respectively.Type: ApplicationFiled: August 30, 2007Publication date: September 10, 2009Applicant: Semiconductor Insights, Inc.Inventors: Linda Wallace, Vyacheslav Zavadsky, Edward Keyes, Jason White
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Publication number: 20090092285Abstract: A schematic diagram detailing a circuit that was reverse engineered from a plurality of images taken of the circuit is provided. The schematic diagram includes at least one circuit element that was represented as an object in at least one of the plurality of images, such that signal continuity information was determined through local tracing of connectivity between a first image and a second image of the plurality of images. A method of tracing the connectivity within the plurality of images to produce the schematic diagram is also disclosed.Type: ApplicationFiled: February 11, 2008Publication date: April 9, 2009Applicant: Semiconductor Insights, Inc.Inventors: Edward Keyes, Vyacheslav L. Zavadsky
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Patent number: 6907583Abstract: A method and apparatus for extracting circuit design information from a pre-existing semiconductor integrated circuit (IC) or at least a portion thereof is described. It includes imaging at least a portion of two or more physical layers of the pre-existing IC to obtain stored electronic images of the physical IC layers, converting the stored electronic images of the physical IC layers to a vector format data, horizontally and vertically aligning the vector format data of the electronic stored images of the physical IC layers, and providing a multi-layer display of the aligned vector format data. A net-list or schematic is generated from the multi-layer display of the vector format data. The net-list and/or schematic may be generated as a number of individual pages by providing a template of circuit elements and placing a circuit element over a portion of the display corresponding to the circuit element. The template of circuit elements may include transistors, logic gates or complex circuit blocks.Type: GrantFiled: October 10, 2002Date of Patent: June 14, 2005Assignee: Semiconductor Insights, Inc.Inventors: Jason Abt, Thomas Kapler, Stephen Begg
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Publication number: 20030084409Abstract: A method and apparatus for extracting circuit design information from a pre-existing semiconductor integrated circuit (IC) or at least a portion thereof is described. It includes imaging at least a portion of two or more physical layers of the pre-existing IC to obtain stored electronic images of the physical IC layers, converting the stored electronic images of the physical IC layers to a vector format, horizontally and vertically aligning the vector format data of the electronic images of the physical IC layers, and providing a multi-layer display of the aligned vector data. A net-list or schematic is generated from the multi-layer display of the vector data. The netlist and/or schematic may be generated as a number of individual pages by providing a template of circuit elements and placing a circuit element over a portion of the display corresponding to the circuit element. The template of circuit elements may include transistors, logic gates or complex circuit blocks.Type: ApplicationFiled: October 10, 2002Publication date: May 1, 2003Applicant: Semiconductor Insights, Inc.Inventors: Jason Abt, Thomas Kapler, Stephen Begg
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Publication number: 20020020746Abstract: A system and a method for optical coding are provided in which an identifier includes information about optically coded information that is stored in one or more dimensions in a logo and/or design. The identifier and the optically coded information are structured to blend in with or hide within the logo and/or design.Type: ApplicationFiled: September 6, 2001Publication date: February 21, 2002Applicant: SEMICONDUCTOR INSIGHTS, INC.Inventor: Alexander R. Roustaei
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Patent number: 6289116Abstract: A method for extracting design information from a semiconductor integrated circuit (IC) or at least a portion thereof comprising the steps of: (a) imaging at least a portion of one or more IC layers to obtain stored images of said portions of the IC; (b) using manual or automatic registration techniques to mosaic images; (c) using an IC layout package possessing a feature of allowing images to be displayed and moved and polygons to be created to allow the recreation of the IC layout in the form of polygons; (d) exporting or storing of a polygon database in a standard IC layout format; (e) creating a table of transistor connections (netlist); (f) organizing circuit netlist into functional blocks of increasing complexity; and (g) generating a schematic diagram.Type: GrantFiled: September 26, 1997Date of Patent: September 11, 2001Assignee: Semiconductor Insights, Inc.Inventors: George Chamberlain, Larry Lam
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Patent number: 6236746Abstract: A method for analyzing an integrated circuit (IC). At least a portion of a layer of the IC is scanned using high magnification, to obtain images of the IC. The images are registered to create a mosaicked image. An IC layout database is created in the form of a set of polygons from the mosaicked image, where the step of creating the IC layout database is performed after, or pipelined with, the registering step. The process is repeated for plural IC layers, as necessary. Polygon sets from each layer are vertically registered into alignment with minimal distortion. A netlist or schematic diagram is generated to represent the scanned IC portion based on the registered set(s) of polygons.Type: GrantFiled: October 1, 1997Date of Patent: May 22, 2001Assignee: Semiconductor Insights, Inc.Inventors: George Chamberlain, Alexi Ioudovski, John-Scott Thomas, Ghassan Naim