Patents Assigned to Semiconductor Insights, Inc.
  • Patent number: 8606041
    Abstract: A schematic diagram detailing a circuit that was reverse engineered from a plurality of images taken of the circuit is provided. The schematic diagram includes at least one circuit element that was represented as an object in at least one of the plurality of images, such that signal continuity information was determined through local tracing of connectivity between a first image and a second image of the plurality of images. A method of tracing the connectivity within the plurality of images to produce the schematic diagram is also disclosed.
    Type: Grant
    Filed: February 11, 2008
    Date of Patent: December 10, 2013
    Assignee: Semiconductor Insights, Inc.
    Inventors: Edward Keyes, Vyacheslav L. Zavadsky
  • Patent number: 8122053
    Abstract: A method of normalizing a bibliographic field of a structured field relational database is disclosed. The method includes weighting potential candidate records according to the value in the corresponding field in the records, together with other related fields in the candidate record and other related records in the database. Each of the candidate records is successively evaluated and compared against an acceptable threshold. If the weight exceeds the threshold, the candidate record is returned from the query. Otherwise, a new entry in the database is created. Optionally, before creating such a new entry, the highest weighted candidate record may be compared against a minimally acceptable threshold and if the weight exceeds such a lower threshold, the candidate is returned from the query.
    Type: Grant
    Filed: January 7, 2008
    Date of Patent: February 21, 2012
    Assignee: Semiconductor Insights, Inc.
    Inventor: Jason M. White
  • Patent number: 7886258
    Abstract: A method and apparatus to reduce occurrences of electrically non-functional elements, known as dummy features, from a source data structure is described. The source data structure may be image data, a vector based data structure or some other data format. Dummy features in the source data structure are detected and then deleted. Dummy features may be detected by selecting a representative dummy feature, using it as a reference pattern or polygon and comparing it to features in the source data structure. The step of comparing the selected reference to the comprises selecting a cut-off correlation threshold value, and computing the correlation coefficients between the reference and the feature. Features are selectively removed based on a comparison between their correlation coefficients and the selected cut-off correlation threshold value. This threshold value may require updating to remove all dummy features in the source data structure.
    Type: Grant
    Filed: June 15, 2010
    Date of Patent: February 8, 2011
    Assignee: Semiconductor Insights, Inc.
    Inventors: Mohammed Ouali, Jason Abt, Edward Keyes, Vyacheslav Zavadsky
  • Publication number: 20090228518
    Abstract: A method and system for organizing and managing claim elements and reference objects is disclosed. The method and system establish database links between claim elements and reference objects based on associations identified between them. These database links are then stored in the database for future reference. The links are also used to derive additional associations between other claim elements and reference objects. The method and the system also enable the displaying of claim elements and reference objects to users in a way that illustrates the associations between the claim elements and reference objects. Associations may be defined based on similarities or dissimilarities between claim elements and reference objects, and amongst claim elements and reference objects, respectively.
    Type: Application
    Filed: August 30, 2007
    Publication date: September 10, 2009
    Applicant: Semiconductor Insights, Inc.
    Inventors: Linda Wallace, Vyacheslav Zavadsky, Edward Keyes, Jason White
  • Publication number: 20090092285
    Abstract: A schematic diagram detailing a circuit that was reverse engineered from a plurality of images taken of the circuit is provided. The schematic diagram includes at least one circuit element that was represented as an object in at least one of the plurality of images, such that signal continuity information was determined through local tracing of connectivity between a first image and a second image of the plurality of images. A method of tracing the connectivity within the plurality of images to produce the schematic diagram is also disclosed.
    Type: Application
    Filed: February 11, 2008
    Publication date: April 9, 2009
    Applicant: Semiconductor Insights, Inc.
    Inventors: Edward Keyes, Vyacheslav L. Zavadsky
  • Patent number: 6907583
    Abstract: A method and apparatus for extracting circuit design information from a pre-existing semiconductor integrated circuit (IC) or at least a portion thereof is described. It includes imaging at least a portion of two or more physical layers of the pre-existing IC to obtain stored electronic images of the physical IC layers, converting the stored electronic images of the physical IC layers to a vector format data, horizontally and vertically aligning the vector format data of the electronic stored images of the physical IC layers, and providing a multi-layer display of the aligned vector format data. A net-list or schematic is generated from the multi-layer display of the vector format data. The net-list and/or schematic may be generated as a number of individual pages by providing a template of circuit elements and placing a circuit element over a portion of the display corresponding to the circuit element. The template of circuit elements may include transistors, logic gates or complex circuit blocks.
    Type: Grant
    Filed: October 10, 2002
    Date of Patent: June 14, 2005
    Assignee: Semiconductor Insights, Inc.
    Inventors: Jason Abt, Thomas Kapler, Stephen Begg
  • Publication number: 20030084409
    Abstract: A method and apparatus for extracting circuit design information from a pre-existing semiconductor integrated circuit (IC) or at least a portion thereof is described. It includes imaging at least a portion of two or more physical layers of the pre-existing IC to obtain stored electronic images of the physical IC layers, converting the stored electronic images of the physical IC layers to a vector format, horizontally and vertically aligning the vector format data of the electronic images of the physical IC layers, and providing a multi-layer display of the aligned vector data. A net-list or schematic is generated from the multi-layer display of the vector data. The netlist and/or schematic may be generated as a number of individual pages by providing a template of circuit elements and placing a circuit element over a portion of the display corresponding to the circuit element. The template of circuit elements may include transistors, logic gates or complex circuit blocks.
    Type: Application
    Filed: October 10, 2002
    Publication date: May 1, 2003
    Applicant: Semiconductor Insights, Inc.
    Inventors: Jason Abt, Thomas Kapler, Stephen Begg
  • Publication number: 20020020746
    Abstract: A system and a method for optical coding are provided in which an identifier includes information about optically coded information that is stored in one or more dimensions in a logo and/or design. The identifier and the optically coded information are structured to blend in with or hide within the logo and/or design.
    Type: Application
    Filed: September 6, 2001
    Publication date: February 21, 2002
    Applicant: SEMICONDUCTOR INSIGHTS, INC.
    Inventor: Alexander R. Roustaei
  • Patent number: 6289116
    Abstract: A method for extracting design information from a semiconductor integrated circuit (IC) or at least a portion thereof comprising the steps of: (a) imaging at least a portion of one or more IC layers to obtain stored images of said portions of the IC; (b) using manual or automatic registration techniques to mosaic images; (c) using an IC layout package possessing a feature of allowing images to be displayed and moved and polygons to be created to allow the recreation of the IC layout in the form of polygons; (d) exporting or storing of a polygon database in a standard IC layout format; (e) creating a table of transistor connections (netlist); (f) organizing circuit netlist into functional blocks of increasing complexity; and (g) generating a schematic diagram.
    Type: Grant
    Filed: September 26, 1997
    Date of Patent: September 11, 2001
    Assignee: Semiconductor Insights, Inc.
    Inventors: George Chamberlain, Larry Lam
  • Patent number: 6236746
    Abstract: A method for analyzing an integrated circuit (IC). At least a portion of a layer of the IC is scanned using high magnification, to obtain images of the IC. The images are registered to create a mosaicked image. An IC layout database is created in the form of a set of polygons from the mosaicked image, where the step of creating the IC layout database is performed after, or pipelined with, the registering step. The process is repeated for plural IC layers, as necessary. Polygon sets from each layer are vertically registered into alignment with minimal distortion. A netlist or schematic diagram is generated to represent the scanned IC portion based on the registered set(s) of polygons.
    Type: Grant
    Filed: October 1, 1997
    Date of Patent: May 22, 2001
    Assignee: Semiconductor Insights, Inc.
    Inventors: George Chamberlain, Alexi Ioudovski, John-Scott Thomas, Ghassan Naim