Abstract: A modular probe system that includes components that are selected to test different devices-under-test (DUTs) in a number of different scientific fields. The system includes quick-release connectors that may be used to releasably secure components of the modular probe system to one another or to a mounting interface. These connectors permit quick and easy attachment and detachment of various components in a manner that permits a user to readily configure the probe system for each DUT.
Type:
Grant
Filed:
January 31, 2008
Date of Patent:
July 27, 2010
Assignee:
SemiProbe LLC
Inventors:
Mostafa Daoudi, Don Feuerstein, Denis Place