Patents Assigned to Sensor, Inc.
  • Patent number: 7014992
    Abstract: The invention relates to nucleic acids covalently coupled to electrodes via conductive oligomers. More particularly, the invention is directed to the site-selective modification of nucleic acids with electron transfer moieties and electrodes to produce a new class of biomaterials, and to methods of making and using them.
    Type: Grant
    Filed: June 12, 1997
    Date of Patent: March 21, 2006
    Assignee: Clinical Micro Sensors, Inc.
    Inventors: Jon Faiz Kayyem, Stephen D. O'Connor, Michael Gozin, Changjun Yu, Thomas J. Meade
  • Publication number: 20060058690
    Abstract: An automatic skin perfusion measuring device automatically analyzes perfusion measurements to identify motion artifact and SPP values. Motion artifact is ignored. Perfusion measurements are designated as SPP values if various criteria are met. SPP value criteria pertain to factors including cuff pressure, perfusion, perfusion change percentages relative to previous and subsequent perfusion measurements, and whether perfusion measurements are increasing or decreasing relative to previous and subsequent perfusion measurements.
    Type: Application
    Filed: August 5, 2005
    Publication date: March 16, 2006
    Applicant: Optical Sensors, Inc.
    Inventors: Daniel Bartnik, Brandon Reynolds
  • Patent number: 6996488
    Abstract: A sensor signal conditioner for temperature compensating, linearizing, and amplifying sensor signal output in electronic instrumentation circuits includes a programmable gain instrument amplifier having an input connected to a sensor; and a comparator for comparing an output voltage of the amplifier to a desired output voltage value. A micro-controller controls the instrument amplifier gain and offset. A mode switch converts an I/O pin to input the desired output voltage value in programming mode and connects the I/O pin to the amplifier output in user mode. A memory stores a programming protocol in the sensor signal conditioner so that in programming mode, the protocol stores programmed values and linearly fits the programmed values to set trim values for temperature compensating, linearizing, and amplifying the instrument amplifier output. The I/O pins and mode switches of several sensor signal conditioners can be controlled simultaneously to mass produce transducers using the sensor signal conditioner.
    Type: Grant
    Filed: October 15, 2002
    Date of Patent: February 7, 2006
    Assignee: Advanced Custom Sensors, Inc.
    Inventors: Charles Chu, Michael Young
  • Patent number: 6995557
    Abstract: A sensor that characterizes welds in materials. The sensor includes a meandering drive winding with at least three extended portions and at least one sensing element placed between an adjacent pair of extended portions. A time varying electric current is passed through the extended portions to form a magnetic field. The sensor is placed in proximity to the test material and translated over the weld region. An electrical property of the weld region is measured for each sensing element location. The weld quality is determined using a feature of the electrical property measurement and location.
    Type: Grant
    Filed: February 27, 2004
    Date of Patent: February 7, 2006
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Vladimir A. Zilberstein, Darrell E. Schlicker, David C. Grundy, Ian Shay, Andrew P. Washabaugh
  • Patent number: 6992482
    Abstract: Magnetic field sensor probes are disclosed which comprise primary or drive windings having a plurality of current carrying segments. The relative magnitude and direction of current in each segment are adjusted so that the resulting interrogating magnetic field follows a desired spatial distribution. By changing the current in each segment, more than one spatial distribution for the magnetic field can be imposed within the same sensor footprint. Example envelopes for the current distributions approximate a sinusoid in Cartesian coordinates or a first-order Bessel function in polar coordinates. One or more sensing elements are used to determine the response of a test material to the magnetic field. These sense elements can be configured into linear or circumferential arrays.
    Type: Grant
    Filed: November 8, 2001
    Date of Patent: January 31, 2006
    Assignee: Jentek Sensors, Inc.
    Inventors: Ian Shay, Neil J. Goldfine, Andrew P. Washabaugh, Darrell E. Schlicker
  • Publication number: 20060020179
    Abstract: The invention provides a device for contacting a surface of a patient's body to determine a physiologic parameter in a measurement region of a tissue of the patient. The device typically comprises a sensor responsive to the physiologic parameter and a probe housing the sensor. The probe is constructed to allow the sensor to be secured at a sensing site adjacent to the measurement region, without disturbing the blood flow within the measurement region of the tissue. The device may also include a means for reducing interference in the sensing area. Preferably, the device further comprises an indicating means operably connected to the sensor for indicating an analyte quantity and/or concentration associated with the physiologic parameter.
    Type: Application
    Filed: July 20, 2005
    Publication date: January 26, 2006
    Applicant: Optical Sensors, Inc.
    Inventors: Edward Anderson, Brandon Reynolds, Kent Winger, Victor Kimball
  • Publication number: 20060009865
    Abstract: The condition of internal or hidden material layers or interfaces is monitored and used for control of a process that changes a condition of a material system. The material system has multiple component materials, such as layers or embedded constituents, or can be represented with multiple layers to model spatial distributions in the material properties. The material condition changes as a result of a process performed on the material, such as by cold working, or from functional operation. Sensors placed proximate to the test material surface or embedded between material layers are used to monitor a material property using magnetic, electric, or thermal interrogation fields. The sensor responses are converted into states of the material condition, such as temperature or residual stress, typically with a precomputed database of sensor responses.
    Type: Application
    Filed: March 14, 2005
    Publication date: January 12, 2006
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil Goldfine, Vladimir Zilberstein, Ian Shay, Christopher Craven, David Grundy, Volker Weiss, Andrew Washabaugh
  • Patent number: 6977151
    Abstract: The invention relates to nucleic acids covalently coupled to electrodes via conductive oligomers. More particularly, the invention is directed to the site-selective modification of nucleic acids with electron transfer moieties and electrodes to produce a new class of biomaterials, and to methods of making and using them.
    Type: Grant
    Filed: February 20, 2002
    Date of Patent: December 20, 2005
    Assignee: Clinical Micro Sensors, Inc.
    Inventors: Jon Faiz Kayyem, Stephen D. O'Connor, Michael Gozin, Changjun Yu, Thomas J. Meade
  • Patent number: 6965485
    Abstract: A lens fixing structure for an optical module of a scanner, a multi-function printer, a fax machine or a copy machine is disclosed. The lens fixing structure for an optical module of a scanner, a multi-function printer, a fax machine or a copy machine, wherein the optical module has a housing, and the lens fixing structure is installed on the housing, includes a slot structure for placing and fixing a lens therein, wherein the slot structure includes a first slot wall positioned on the housing; and a second slot wall positioned on the housing and being parallel to the first slot wall, wherein the second slot wall is perpendicular to a surface of the housing.
    Type: Grant
    Filed: February 2, 2004
    Date of Patent: November 15, 2005
    Assignee: Creative Sensor Inc.
    Inventors: Su Ling Ta, Lin Ming Fang
  • Publication number: 20050248339
    Abstract: Inductive sensors measure the near surface properties of conducting and magnetic material. A sensor may have primary windings with parallel extended winding segments to impose a spatially periodic magnetic field in a test material. Those extended portions may be formed by adjacent portions of individual drive coils. Sensing elements provided every other half wavelength may be connected together in series while the sensing elements in adjacent half wavelengths are spatially offset. Certain sensors include circular segments which create a circularly symmetric magnetic field that is periodic in the radial direction. Such sensors are particularly adapted to surround fasteners to detect cracks and can be mounted beneath a fastener head. In another sensor, sensing windings are offset along the length of parallel winding segments to provide material measurements over different locations when the circuit is scanned over the test material.
    Type: Application
    Filed: February 11, 2005
    Publication date: November 10, 2005
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil Goldfine, Darrell Schlicker, David Grundy, Mark Windoloski, Ian Shay, Andrew Washabaugh
  • Publication number: 20050244039
    Abstract: A method for assisting a user of a fingerprint sensing system includes sensing a position of a user's finger relative to a swiped fingerprint image sensor, and providing to the user, in response to the sensed finger position, an indication of finger placement relative to the fingerprint image sensor. The indication of finger placement may include a display on a computer monitor of actual finger placement and desired finger placement. The fingerprint sensing system may include an image sensor to sense a fingerprint on a swiped finger, a finger position sensor to sense the position of the finger relative to the image sensor, and processing apparatus to provide the indication of finger placement to the user.
    Type: Application
    Filed: April 22, 2005
    Publication date: November 3, 2005
    Applicant: Validity Sensors, Inc.
    Inventors: David Geoffroy, Jeffrey Buxton
  • Publication number: 20050244038
    Abstract: A finger position sensing apparatus, typically used in a fingerprint sensing system, includes a position pickup plate disposed generally orthogonally with respect to an expected direction of movement of a finger and a plurality of position drive plates having different spacings from the position pickup plate to define plurality of position sensor gaps between respective position drive plates and the position pickup plate. The position drive plates are dimensioned and spaced from the position pickup plate to sense the bulk of a finger rather than fingerprint features.
    Type: Application
    Filed: April 15, 2005
    Publication date: November 3, 2005
    Applicant: Validity Sensors, Inc.
    Inventor: Fred Benkley
  • Patent number: 6960467
    Abstract: The invention relates to a microfluidic device with microchannels that have separated regions which have a member of a specific binding pair member such as DNA or RNA bound to porous polymer, beads or structures fabricated into the microchannel. The microchannels of the invention are fabricated from plastic and are operatively associated with a fluid propelling component and detector.
    Type: Grant
    Filed: December 19, 2001
    Date of Patent: November 1, 2005
    Assignee: Clinical Micro Sensors, Inc.
    Inventors: Chan-Long Shieh, Barbara Foley, Huinan Yu, Vi-En Choong
  • Patent number: 6952095
    Abstract: Inductive sensors measure the near surface properties of conducting and magnetic material. A sensor may have primary windings with parallel extended winding segments to impose a spatially periodic magnetic field in a test material. Those extended portions may be formed by adjacent portions of individual drive coils. Sensing elements provided every other half wavelength may be connected together in series while the sensing elements in adjacent half wavelengths are spatially offset. Certain sensors include circular segments which create a circularly symmetric magnetic field that is periodic in the radial direction. Such sensors are particularly adapted to surround fasteners to detect cracks and can be mounted beneath a fastener head. In another sensor, sensing windings are offset along the length of parallel winding segments to provide material measurements over different locations when the circuit is scanned over the test material.
    Type: Grant
    Filed: September 20, 2000
    Date of Patent: October 4, 2005
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Andrew P. Washabaugh, Vladimir A. Zilberstein, Vladimir Tsukernik
  • Patent number: 6946695
    Abstract: The present invention provides a solid-state rotational rate sensor device formed by a thin-film for generating an electrical voltage output proportional to the rate of rotational motion. The precision thin-film piezoelectric elements are configured and arranged on a semi-rigid structure to detect rotation (such as pitch, roll, and yaw) while rejecting spurious noise created by vibration, thermal gradients, and electro-magnetic interference.
    Type: Grant
    Filed: August 7, 2003
    Date of Patent: September 20, 2005
    Assignee: Triad Sensors, Inc.
    Inventor: Peter J. Schiller
  • Patent number: 6942771
    Abstract: The invention relates generally to methods and apparatus for conducting analyses, particularly microfluidic devices for the detection of target analytes.
    Type: Grant
    Filed: April 21, 1999
    Date of Patent: September 13, 2005
    Assignee: Clinical Micro Sensors, Inc.
    Inventor: Jon Faiz Kayyem
  • Publication number: 20050168844
    Abstract: A lens fixing structure for an optical module of a scanner, a multi-function printer, a fax machine or a copy machine is disclosed. The lens fixing structure for an optical module of a scanner, a multi-function printer, a fax machine or a copy machine, wherein the optical module has a housing, and the lens fixing structure is installed on the housing, includes a slot structure for placing and fixing a lens therein, wherein the slot structure includes a first slot wall positioned on the housing; and a second slot wall positioned on the housing and being parallel to the first slot wall, wherein the second slot wall is perpendicular to a surface of the housing.
    Type: Application
    Filed: February 2, 2004
    Publication date: August 4, 2005
    Applicant: Creative Sensor Inc.
    Inventors: Ling Su, Ming Lin
  • Publication number: 20050171703
    Abstract: Methods are described for assessing material condition. These methods include the use of multiple source fields for interrogating and loading of a multicomponent test material. Source fields include electric, magnetic, thermal, and acoustic fields. The loading field preferentially changes the material properties of a component of the test material, which allows the properties of the component materials to be separated. Methods are also described for monitoring changes in material state using separate drive and sense electrodes with some of the electrodes positioned on a hidden or even embedded material surface. Statistical characterization of the material condition is performed with sensor arrays that provide multiple responses for the material condition during loading. The responses can be combined into a statistical population that permits tracking with respect to loading history.
    Type: Application
    Filed: January 14, 2005
    Publication date: August 4, 2005
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil Goldfine, Darrell Schlicker, Vladimir Zilberstein, Andrew Washabaugh, Volker Weiss, Christopher Craven, Ian Shay, David Grundy, Karen Walrath, Robert Lyons
  • Publication number: 20050146324
    Abstract: Fabrication of samples having material conditions or damage representative of actual components inspected by nondestructive testing involves sensors placed near or mounted on the material surface, such as flexible eddy current sensors or sensor arrays, to monitor the material condition while the sample is being processed. These sample typically have real cracks in or around holes, on curved surfaces, in and under coatings, and on shot peened or otherwise preconditioned surfaces. Processing, such as mechanical or thermal loading to introduce fatigue damage, is stopped once the material condition reaches a predetermined level.
    Type: Application
    Filed: November 15, 2004
    Publication date: July 7, 2005
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil Goldfine, Vladimir Zilberstein, David Grundy, Volker Weiss, Andrew Washabaugh
  • Publication number: 20050127908
    Abstract: Methods and apparatus are described for absolute electrical property measurement of materials. This is accomplished with magnetic and electric field based sensors and sensor array geometries that can be modeled accurately and with impedance instrumentation that permits accurate measurements of the in-phase and quadrature phase signal components. A dithering calibration method is also described which allows the measurement to account for background material noise variations. Methods are also described for accounting for noise factors in sensor design and selection of the optimal operating conditions which can minimize the error bounds for material property estimates. Example application of these methods to automated engine disk slot inspection and assessment of the mechanical condition of dielectric materials are presented.
    Type: Application
    Filed: October 12, 2004
    Publication date: June 16, 2005
    Applicant: JENTEK Sensors, Inc.
    Inventors: Darrell Schlicker, Neil Goldfine, David Grundy, Robert Lyons, Vladimir Zilberstein, Andrew Washabaugh, Vladimir Tsukernik, Mark Windoloski, Ian Shay