Abstract: A method and system are described for generating a quantified perception profile of a predetermined stimulus. The method may be used in colorimetry or flavor quantization. Flavor descriptors are selected from database for the particular product and presented pairwise in all possible pair combinations to each of a plurality of tasters via user-devices. For each flavor descriptor pair, users select one of the descriptors which is perceived to be more intense than the other. The results of the selections are captured at host and mapped by normalizing means as intensity values into a flavor descriptor space in database to create a quantized flavor profile. Normalizing means performs a weighting on each descriptor selection result. Filtering means detects anomalous or inconsistent selection responses and issues adaptive control instructions.

Abstract: A method for measuring the thickness of coatings on a substrate of an aerospace component comprises illuminating a sample comprising the substrate of the aerospace component and a coating with light waves of varying wavelengths from a light source, receiving the light waves reflected by the sample at a light collector, diffracting the light waves into a plurality of component wavelengths with a grating, detecting the light intensities of the plurality of component wavelengths at a detector array, generating a reflectance spectral curve using the detected light intensities for each of the plurality of component wavelengths, calculating the thickness of the coating from the reflectance spectral curves of the component wavelengths.

Abstract: A method for measuring the thickness of coatings on a substrate of an aerospace component comprises illuminating a sample comprising the substrate of the aerospace component and a coating with light waves of varying wavelengths from a light source, receiving the light waves reflected by the sample at a light collector, diffracting the light waves into a plurality of component wavelengths with a grating, detecting the light intensities of the plurality of component wavelengths at a detector array, generating a reflectance spectral curve using the detected light intensities for each of the plurality of component wavelengths, calculating the thickness of the coating from the reflectance spectral curves of the component wavelengths.

Abstract: A method for measuring a thickness of a coating includes illuminating a substrate of an appliance with light waves of varying wavelengths from a light source. The method further includes receiving the light waves reflected by a top surface and a bottom surface of the coating at a light collector. The method may further include diffracting the light waves into a plurality of component wavelengths with a grating, and detecting light intensities of the plurality of component wavelengths at a detector array. The method may further include calculating a thickness of the coating from the detected light intensities.

Abstract: Method for measuring thickness of coatings includes illuminating an automobile sample comprising a substrate and at least one coating with light waves of varying wavelengths from a light source. It further includes receiving the light waves reflected by a top surface and a bottom surface of the coating on the sample at the light collector. It also includes diffracting the light waves into a plurality of component wavelengths with a grating, detecting light intensities of the plurality of component wavelengths at a detector array, generating a combined reflected interference pattern spectral curve using the detected light intensities for each of the received light waves for each of the plurality of component wavelengths, and calculating a thickness of the at least one coating from a frequency of the combined reflected interference pattern spectral curve of the component wavelengths.

Abstract: A method for measuring the thickness of coatings on metal substrates comprises illuminating a sample comprising a substrate and a coating with light waves of varying wavelengths from a light source, receiving the light waves reflected by the sample at a light collector, diffracting the light waves into a plurality of component wavelengths with a grating, detecting the light intensities of the plurality of component wavelengths at a detector array, generating a reflectance spectral curve using the detected light intensities for each of the plurality of component wavelengths, calculating the thickness of the coating from the reflectance spectral curves of the component wavelengths.

Abstract: The present disclosure is generally directed to methods and systems for measuring the thickness of coatings or thin films on various substrates. For example, one disclosed method includes the steps of providing and directing light waves of varying wavelengths toward a moving substrate comprising a coating, linearly polarizing the light waves, converting the linearly polarized light waves to circularly polarized light waves, analyzing elliptically polarized light waves reflected by the moving substrate, capturing analyzed light waves, generating light wave data based on the captured light waves, and determining a thickness of the coating based on the light wave data.

Abstract: An anodizing system for forming a anodized coating on at least a portion of a substrate thereby creating an anodized substrate is disclosed. The anodizing system includes a bath, a coating thickness monitor, at least one probe and at least one controller. The coating thickness monitor includes at least one radiation source directed at at least a portion of the anodized substrate; at least one probe for capturing at least a portion of the radiation reflected and refracted by the anodized coating on the anodized substrate, the captured radiation being at least a portion of the radiation directed the anodized substrate from the radiation source; and at least one detector in communication with the at least one probe, the at least one detector capable of processing the captured radiation to allow a determination of at least the thickness.