Patents Assigned to Serstech AB
  • Patent number: 12607565
    Abstract: The present inventive concept relates to a method (100) for identifying a set of candidate substances of a sample (10) using a Raman spectroscopy device (200). The method (100) comprises recording (120) a Raman spectrum using an exposure time, and recording (162) a further Raman spectrum using a further exposure time. The further Raman spectrum may exhibit Raman peaks not recorded/detected in the Raman spectrum which possibly reduces the set of candidate substances. If necessary, one or more additional Raman spectra are recorded to further reduce the set of candidate substances, such that a single candidate substance eventually remains, thereby deemed to be a substance of the sample (10). A Raman spectroscopy device (200), a computer program and a non-transitory computer-readable storage medium are also provided.
    Type: Grant
    Filed: December 15, 2022
    Date of Patent: April 21, 2026
    Assignee: SERSTECH AB
    Inventor: Peter Billsten
  • Patent number: 11397151
    Abstract: A device for detection of a substance by Raman spectroscopy comprises a holder (40) with an area (41) adapted for receiving a sample of the substance and a vibration engine (42). The vibration engine (42) is configured to move the holder (40) in a three-dimensional motion when the area (41) with the substance is arranged in front of a focusing lens (FL) of the spectrometer to provide a large actual sampling area and hence to achieve a strong signal at detection. The device comprises a SERS surface (30) arranged at the area (41) of the holder (40) for adsorption of the sample of the substance. A method for detection of a substance by use of the device is also presented.
    Type: Grant
    Filed: June 18, 2020
    Date of Patent: July 26, 2022
    Assignee: SERSTECH AB
    Inventors: Katja Szybek, Peter Billsten, Johan Diedrichs
  • Patent number: 10295408
    Abstract: A spectroscopy system (10) for analyzing in-elastic scattered electromagnetic radiation from an object being irradiated by electromagnetic radiation is provided. The system comprises a tunable lens assembly (13) having a tunable lens provided in the beam path between an electromagnetic radiation source (11) and the object (0) and arranged to project a beam of electromagnetic radiation emitted from the electromagnetic radiation source onto an area of the object and receive and collimate the in-elastic scattered electromagnetic radiation from the object. Based on electromagnetic radiation detected by at least a first detector (121) a control unit (14) is capable making a decision to change the operational settings of the tunable lens.
    Type: Grant
    Filed: June 1, 2016
    Date of Patent: May 21, 2019
    Assignee: SERSTECH AB
    Inventors: Katja Szybek, Jan Sonnvik
  • Patent number: 7764374
    Abstract: The present invention relates to a micro total analysis system comprising a spectroscope and a method of manufacturing such a system comprising a spectroscope in a one step process. More over the invention relates to a method of analyzing a sample in the system. The micro total analysis system comprising a spectroscope provided on a substrate and for measuring electromagnetic radiation and at least one microfluidic channel. The spectroscope comprises: a slab waveguide for guiding electromagnetic waves towards a diffraction grating dispersing the electromagnetic waves into their component wavelengths, and output means for receiving the deflected electromagnetic waves. At least a part of the microfluidic channel, the slab waveguide and the grating comprises the same main material, such as a polymer material.
    Type: Grant
    Filed: July 14, 2005
    Date of Patent: July 27, 2010
    Assignee: Serstech AB
    Inventors: Jörg Hübner, Anders Michael Jørgensen, Thomas Aarøe Anhøj, Dan Anker Zauner