Abstract: A withstand voltage of a connector-coupled cable is checked by the device equipped with a pair of electrode boxes, and a control block configured to apply a start signal to a test instrument, which outputs a preset high voltage, according to an electrical state detected in each electrode box in which a housing whose a part of a front side is open; a conductive electrode plate mounted on an inner front side of the housing in such a way that it is rotatable around its top end, and a switch unit, mounted inside the housing with a predetermined gap from the electrode plate, to detect whether the electrode plate is rotated due to push on a lower part of the electrode plate are installed, wherein the electrical state is an electrical state between both terminals of the detection unit, and the preset high voltage is applied between both electrode plates.

Abstract: Disclosed is a device comprises: a moving block configured to have an inner space open toward one side, and to be capable of moving in forward direction toward a holder, formed on a connector jig, and in backward direction; a matching box, movably mounted in the moving block to be movable, of which shape is such that its movement in the forward direction is blocked by a part of a TPA connector seated in the holder if the part protrudes from the connector surface; and a contact switch configured to change its electrical state when the matching box moves, relative to the moving block, at a predetermined interval in the backward direction, wherein the moving block is configured to move further in the forward direction by at least the predetermined interval even in a state in which the matching box cannot move in the first direction.

Abstract: A micrometer according to the present invention comprises: a frame of conductive material; an anvil of conductive material that is fixedly coupled to one end of the frame in an electrically insulated manner from the frame; a spindle of conductive material coupled to other end of the frame in such a way as to be moved back and forth along direction of the anvil in synchronization with rotation of a thimble while making electrical contact with the frame; and a controller configured to transmit a value for current gap between the anvil and the spindle to an external device as a measurement in case the anvil and the frame are electrically short-circuited. This configuration of the micrometer allows a measurement to be sent to the external device only in the case that a conductive object is necessarily mounted between the anvil and the spindle and electrically short-circuits them.