Abstract: The present disclosure provides devices, systems, and methods for time correction. The device may include a first time measurement component configured to measure a receiving time of a valid signal; a correction component configured to collect correction information for correcting the receiving time of the valid signal; and a processing device configured to determine a corrected receiving time of the valid signal by correcting the receiving time of the valid signal based on the correction information.

Abstract: Disclosed are a readout circuit, a signal quantizing method, a signal quantizing device, and a computer device. The readout circuit includes: a signal sampler, including a plurality of channels; a plurality of integrators, connected to the plurality of channels and having a one-to-one relationship with the plurality of channels; a signal processor, including a first operational amplifier, a sampling input of the first operational amplifier being connected to outputs of the plurality of integrators, respectively; and an analog-digital converter. An input of the analog-digital converter is connected to an output of the first operational amplifier.

Abstract: Embodiments of the present disclosure provide a device and a method for noise testing of a substrate including through silicon vias (TSVs). The device may include a substrate including first TSVs; an excitation link including at least two groups of second TSVs; an insulation layer arranged between the excitation link and the substrate; and a testing link including at least one group of third TSVs, the testing link being electrically connected with the substrate.

Abstract: The present disclosure provides a device, comprising: a substrate being provided with a through silicon via; at least one test assembly, each of the at least one test assembly including a surrounding structure, the surrounding structure being arranged around the through silicon via.

Abstract: The present disclosure provides devices, systems, and methods for time correction. The device may include a first time measurement component configured to measure a receiving time of a valid signal; a correction component configured to collect correction information for correcting the receiving time of the valid signal; and a processing device configured to determine a corrected receiving time of the valid signal by correcting the receiving time of the valid signal based on the correction information.

Abstract: Disclosed are a readout circuit, an offset voltage eliminating method and device, a computer device, and a non-transitory computer-readable storage medium. The readout circuit includes an object quantizer and an offset voltage elimination circuit. The offset voltage elimination circuit includes a correction circuit and a calibration circuit, an input of the correction circuit is connected to an output of the object quantizer, a compensation input of the calibration circuit is connected to an output of the current compensator, and a reference input of the calibration circuit is connected to the output of the object quantizer.

Abstract: The present disclosure provides a voltage calibration device, method and imaging system. The voltage calibration device, comprising: a channel selector and a calibration unit, wherein an input end of the channel selector is selectively connected to channels to be calibrated of multiple detectors to receive a common mode voltage of each channel to be calibrated; a first input end of the calibration unit is connected to an output end of the channel selector, an output end of the calibration unit is connected to the multiple channels to be calibrated, the calibration unit adjusting the common mode voltage of each channel to be calibrated to a calibrated common mode voltage to cause each channel to be calibrated to be detected under its corresponding calibrated common mode voltage.

Abstract: The present disclosure provides devices, systems, and methods for time correction. The device may include a first time measurement component configured to measure a receiving time of a valid signal; a correction component configured to collect correction information for correcting the receiving time of the valid signal; and a processing device configured to determine a corrected receiving time of the valid signal by correcting the receiving time of the valid signal based on the correction information.

Abstract: Disclosed are a readout circuit, a signal quantizing method, a signal quantizing device, and a computer device. The readout circuit includes: a signal sampler, including a plurality of channels; a plurality of integrators, connected to the plurality of channels and having a one-to-one releationship with the plurality of channels; a signal processor, including a first operational amplifier, a sampling input of the first operational amplifier being connected to outputs of the plurality of integrators, respectively; and an analog-digital converter. An input of the analog-digital converter is connected to an output of the first operational amplifier.

Abstract: Disclosed are an analog-to-digital conversion circuit, an analog-to-digital conversion device, and a digital x-ray imaging system. The analog-to-digital conversion circuit includes a first reference voltage source, a second reference voltage source, a first analog-to-digital converter connected to the first reference voltage source, a second analog-to-digital converter connected to the second reference voltage source, a connecting circuit connected to the first analog-to-digital converter and the second analog-to-digital converter, respectively, and a current source having negative temperature coefficient configured to be connected to the first reference voltage source and the second reference voltage source, respectively.