Abstract: Disclosed herein is a method of operating a radiation detector, comprising for i=1, . . . , N, during a transfer period (i), electrically connecting pixel (1,i) of pixels (1,j), j=1, . . . , N of the radiation detector to a first signal processing circuit while electrically disconnecting the other N?1 pixels of the pixels (1,j), j=1, . . . , N from the first signal processing circuit; and for i=1, . . . , N, during the transfer period (i), transferring electrical signals from the pixel (1,i) to the first signal processing circuit.

Abstract: Disclosed herein is an apparatus suitable for light scanning. The apparatus may comprise a light source, an optical device and a detector. The light source may be configured to generate a scanning light beam that diverges along a first dimension to illuminate a line along the first dimension in a target scene, and may be configured to scan the scanning light beam in a second dimension perpendicular to the first dimension. The optical device may be configured to converge return light waves reflected off of the target scene to generate converged return light waves. The detector may comprise a light receiving component. The light receiving component may be configured to receive the converged return light waves. The detector may be configure to detect the converged return light waves incident on the light receiving component.

Abstract: Disclosed herein is an apparatus comprising: a probe carrier, an optical system and a sensor; wherein the probe carrier comprises a substrate, a first layer and a second layer; wherein the substrate comprises a first surface, a second surface, one or more locations on the first surface configured to be deposit sites for one or more probes; wherein the second surface is at an opposite side of the substrate from the first surface; wherein the first layer is on the first surface of the substrate or is embedded in the substrate under the first surface; wherein the second layer is on the second surface of the substrate or is embedded in the substrate under the second surface; the first and second layers are configured to reduce crosstalk between probes at different locations.

Abstract: Disclosed herein is an apparatus comprising: a probe carrier comprising: a first substrate comprising a first plurality of through holes in the first substrate, a transparent window attached to the first substrate and across an opening of each of the first plurality of through holes, wherein the transparent window closes the opening; and probes attached to one or more locations on the transparent window, wherein interaction between the probes and an analyte generates a signal; a second substrate comprising a second plurality of through holes in the second substrate, wherein the second plurality of through holes are configured as a plurality of collimators; a sensor comprising a plurality of pixels configured to detect the signal.

Abstract: Disclosed herein is a system comprising: an avalanche photodiode (APD); a bias source configured to supply a reverse bias to the APD; a current meter configured to measure electric current through the APD; a controller configured to reduce the reverse bias to a value below a breakdown voltage of the APD from a value above the breakdown voltage when an intensity of light incident on the APD is above a threshold, and configured to determine the intensity of the light above the threshold based on the electric current through the APD when the reverse bias is below the breakdown voltage.

Abstract: Disclosed herein is a system, which comprises a plurality of processing units. Each of the processing units comprises a first oscillator, a second oscillator, and a counter. Each of the processing units is configured to receive a first input and a second input and to send an output as a function of the first input and the second input. The function has a plurality of parameters. Each of the processing units is configured to receive and send values of the parameters. The system can be used together with a microprocessor to perform parallel computing.

Abstract: Disclosed herein is an apparatus suitable for light scanning. The apparatus comprises a light source and a photonic crystal. The light source is configured to direct a light beam along an optical axis toward the photonic crystal. The photonic crystal is configured to direct the light beam along a direction at an angle relative to the optical axis. The angle is a function of wavelength of the light beam. The apparatus may also comprise a partial toroid lens configured to diverge the light beam received from the photonic crystal. The light source of the apparatus may be configured to change the wavelength continuously across a range of wavelengths.

Abstract: Disclosed herein is a method and apparatus for determining time of arrival of incident photons. The time of arrival may be determined with high time accuracy based on the times a voltage across a capacitor being charged by charge carriers generated from the incident photons at which the voltage reaches a plurality of thresholds, respectively, and the stable value of the voltage.

Abstract: Disclosed herein is a system comprising: an optical system with a focal plane; an apparatus at the focal plane; a filter; wherein the apparatus comprises an array of vertical-cavity surface-emitting lasers (VCSELs) on a first substrate and an array of detectors on a second substrate, the detectors configured to detect laser beams that are emitted by the VCSELs and backscattered by an object; wherein the first substrate is mounted to the second substrate and is configured to allow the laser beams that are emitted by the VCSELs and backscattered by the object to transmit through the first substrate and reach the detectors; wherein the filter is configured to prevent light other than the laser beams from passing.

Abstract: Disclosed herein is an apparatus, which comprises an optical waveguide, a first and second waveguide couplers. The optical waveguide may be configured to receive light from an end surface of the optical waveguide. The first waveguide coupler may be coupled, at a first coupling strength, to a first portion of the optical waveguide. The second waveguide coupler may be coupled, at a second coupling strength, to a second portion of the optical waveguide. Attenuation of the light at the first portion is smaller than attenuation of the light at the second portion. The first coupling strength is smaller than the second coupling strength. The first waveguide coupler and the second waveguide coupler each comprises a surface comprising sites configured to attach a probe.

Abstract: Disclosed herein is a photomultiplier comprising: an electron ejector; a detector; a substrate; and a first electrode in the substrate; a second electrode in the substrate; a third electrode in the substrate; wherein each of the first, second and third electrodes comprises a flat or curved surface at an angle to a normal direction of the substrate; wherein each of the first, second and third electrodes comprises a first end and a second end, the first end being closer to the electron ejector than the second end; wherein the first, second and third electrodes are spatially arranged such that the second ends of the first, second and third electrode are on a same plane, or such that a plane the second ends of the first and third electrodes are on crosses the second electrode.

Abstract: Disclosed herein is a method comprising: emitting electrons from an electron ejector in response to an incident photon; driving the electrons through a hole toward a detector configured to collect the electrons and provide an output signal representative of the incident photon; driving the electrons away from sidewalls of the hole, using an electric field.

Abstract: Disclosed herein is an apparatus comprising: a probe carrier comprising: a substrate comprising with holes through a thickness of the substrate and a transparent window across an opening of each of the holes, wherein the transparent window closes the opening, wherein one or more locations on the transparent window are configured to have probes attached thereto, wherein interaction between the probes and an analyte generates a signal; an optical system comprising a plurality of collimators; a sensor configured to detect the signal; wherein the collimators can essentially prevent light from passing if a deviation of a propagation direction of the light from an optical axis of the collimators is greater than a threshold. Because the probe carrier is separate and independent from the microarray, the probe carrier may be assembled with a pre-existing microarray prior to its use, and be detached from the microarray and disposed after its use.

Abstract: An apparatus comprises an array of vertical-cavity surface-emitting lasers (VCSELs) on a first substrate and an array of detectors on a second substrate, the detectors being configured to detect laser beams emitted by the VCSELs and backscattered by an object, wherein the first substrate is mounted to the second substrate and is configured to allow the laser beams emitted by the VCSELs and backscattered by the object to transmit through the first substrate and reach the detectors.

Abstract: Disclosed herein is a multi-functional microfluidics device capable of isolation of nucleic acids, purification of nucleic acids, performance of Polymerase Chain Reactions (PCRs), in situ hybridization of nucleic acids, fluorescent signal detections and the like. The apparatus comprises an integration of a plurality of reagent chambers, a sample input, a reaction chamber, a detection chamber, and a waste chamber; wherein the plurality of reagent chambers is fluidly connected to the reaction chamber, and is configured to store a plurality of reagents; wherein the sample input is fluidly connected to the reaction chamber, and is configured to receive a sample; wherein the waste chamber is fluidly connect to the reaction chamber and is configured to receive a reaction waste from the reaction chamber.

Abstract: Disclosed herein is a photomultiplier tube (PMT) comprising: an electron ejector configured for emitting primary electrons in response to an incident photon; a detector configured for collecting electrons and providing an output signal representative of the incident photon; and a series of electrodes between the electron ejector and the detector, wherein each of the electrodes is configured for emitting secondary electrons in response to incident electrons, and each of the electrodes includes a bi-metal arc-shaped sheet.

Abstract: Disclosed herein is a photomultiplier comprising: an electron ejector; a detector; a substrate; and a first electrode in the substrate; a second electrode in the substrate; a third electrode in the substrate; wherein each of the first, second and third electrodes comprises a flat or curved surface at an angle to a normal direction of the substrate; wherein each of the first, second and third electrodes comprises a first end and a second end, the first end being closer to the electron ejector than the second end; wherein the first, second and third electrodes are spatially arranged such that the second ends of the first, second and third electrode are on a same plane, or such that a plane the second ends of the first and third electrodes are on crosses the second electrode.

Abstract: Disclosed herein is a photomultiplier comprising: an electron ejector; a detector; a substrate; and a first electrode in the substrate; a second electrode in the substrate; a third electrode in the substrate; wherein each of the first, second and third electrodes comprises a flat or curved surface at an angle to a normal direction of the substrate; wherein each of the first, second and third electrodes comprises a first end and a second end, the first end being closer to the electron ejector than the second end; wherein the first, second and third electrodes are spatially arranged such that the second ends of the first, second and third electrode are on a same plane, or such that a plane the second ends of the first and third electrodes are on crosses the second electrode.

Abstract: A photomultiplier tube (PMT) suitable for detecting a photon, comprising: an electron ejector configured for emitting primary electrons in response to an incident photon; a detector configured for collecting electrons and providing an output signal representative of the incident photon; and a series of vertical electrodes between the electron ejector and the detector, wherein each of the vertical electrodes is configured for emitting secondary electrons in response to incident electrons, and each of the vertical electrodes is parallel to a straight line connecting the electron ejector and the detector.

Abstract: Disclosed herein is an apparatus comprising: a plurality of locations configured to have probes attached thereto, wherein interaction between the probes and an analyte generates a signal; an optical system comprising a plurality of collimators; a sensor comprising a plurality of pixels configured to detect the signal; wherein the collimators are configured to essentially prevent light from passing if a deviation of a propagation direction of the light from an optical axis of the collimators is greater than a threshold.