Abstract: An Ethernet data transmission circuit, an Ethernet data transmission system and an Ethernet data transmission method are provided. The Ethernet data transmission circuit includes: a polarity processing circuit for processing a polarity carried by Ethernet data into a preset polarity; and an encoder for receiving the Ethernet data and the preset polarity carried by the Ethernet data, and encoding the Ethernet data. On the one hand, the security of Ethernet in a transmission process can be improved; on the other hand, without increasing workload of the encoder, the polarity processing circuit of the Ethernet data transmission circuit can be used to process the Ethernet data to be with a preset polarity, to facilitate the encoder to code.

Abstract: The present invention provides a frequency selective circuit, comprising: a voltage-controlled oscillator for outputting a frequency corresponding to the frequency adjustment window; a frequency divider for dividing the clock frequency output by the voltage-controlled oscillator, and feeding back the resulting low frequency to the frequency selection unit; a frequency selective unit for comparing a reference frequency with the resulting low frequency output by the frequency divider, and providing the frequency adjustment window which is configured based on the frequency search window to the voltage-controlled oscillator; a register group for outputting the frequency search window which is provided to the frequency selective unit. The embodiment of the present invention convert the clock frequency from a high frequency to a low frequency. The low frequency is compared with the reference frequency to ultimately find the corresponding low frequency that has the same frequency as the reference frequency.

Abstract: A high-speed sampling circuit is disclosed which comprises a sampling module for amplifying a differential input signal; a latch module for latching the differential output signal of the sampling module; a first control module for controlling the sampling module under a first clock signal; a second control module for controlling the latch module under a second clock signal; a third control module for controlling control the output of the differential output signal under the second clock signal. The high-speed sampling circuit of the disclosure, after sampling the differential input signal, the sampling module outputs it to the latch module and controls the latch module to output the differential output signal, compared to the existing two-stage sampling module, it saves the transmission delay of the two-stage sampling module and can improve the performance of the high-speed sampling band of the signal.

Abstract: Disclosed are a clock and data recovery circuit, method and apparatus. The circuit comprises a receiving module for receiving an analog signal; a first equalization module connected to the receiving module, the first equalization module comprising a first totalizer and a second totalizer; a first sampling module connected to an output end of the first totalizer, the first sampling module comprising a first edge sampler and a second edge sampler that are connected to the output end of the first totalizer, respectively; a second sampling module connected to an output end of the second totalizer; a data processing module connected to both the first sampling module and the second sampling module; a clock recovery module connected to the data processing module; and an output module connected to the clock recovery module. In the present application, by means of the manner, a phase can be adjusted using a bias voltage, thereby accurately recovering clock information.

Abstract: A boundary scan test method is used to test connectivity of a pad having a direct connection to user logic. The method comprises the following steps: configuring an FPGA to enter a test mode; generating by means of user logic, a boundary scan chain for a boundary scan test; loading a boundary scan test instruction to the FPGA, and loading a PRELOAD instruction to a device having a pad to be tested for connectivity; sending, via a TDI port, a first test vector to the pad; performing the boundary scan test, and loading an EXTEST instruction to the device having the pad; and removing first response data from a TDO port, and performing response analysis and fault diagnosis.

Abstract: A SerDes module clock network architecture comprises, a reference clock input port, a plurality of data transmission channels, several user logic interfaces, several frequency division branches and a phase locked loop. The reference lock input port receives an input clock and conveys the input clock to the phase locked loop, the phase locked loop receives the input lock and outputs a PLL output clock signal, the PLL output clock signal is conveyed to the plurality of data transmission channels, and the PLL output clock signal is conveyed to the frequency division branches, and after frequency division, user interface clocks are output and conveyed to the user logic interfaces. When the PLL output clock signal in a SerDes is provided to an internal dedicated channel, several frequency division branches are also divided, and after frequency division, the signal is output to the user logic interfaces for use by an FPGA.

Abstract: A terminal resistance circuit, a chip and a chip communication device are provided. The terminal resistance circuit can be used for a high-speed differential I/O pair and includes two resistance circuits and a control circuit. An end of the two resistance circuits connected in series is connected to a first interface and another end is connected to a second interface. A conductor wire connected between the two resistance circuits has a target node thereon. The two resistance circuits are symmetrically arranged relative to the target node. The control circuit is connected to the two resistance circuits individually and used to control the two resistance circuits each to be in a turn-off state during powering-on of the chip. An abnormal operation caused by a short circuit between two interfaces of a I/O pair during the powering-on of the chip is avoided and the working stability of the chip is improved.

Abstract: The present invention provides a frequency selective circuit. The frequency selection circuit comprises a voltage-controlled oscillator, a frequency divider, a frequency selective unit and a register group, the voltage-controlled oscillator is used to output a frequency corresponding to the frequency adjustment window; the frequency divider is used to divide the clock frequency output by the voltage-controlled oscillator, and to feed back the resulting low frequency to the frequency selection unit; the frequency selective unit is used to compare a reference frequency with the resulting low frequency output by the frequency divider, and to provide the frequency adjustment window which is configured based on the frequency search window to the voltage-controlled oscillator. The register group is used to output the frequency search window which is provided to the frequency selective unit.

Abstract: A high-speed sampling circuit is disclosed which comprises a sampling module, a latch module, a first control module, a second control module, and a third control module, the sampling module is used to amplify a differential input signal; the latch module is used to latch the differential output signal of the sampling module; the first control module is used to control the sampling module under a first clock signal; the second control module is used to control the latch module under a second clock signal; the third control module is used to control the output of the differential output signal under the second clock signal.

Abstract: A power management system and method for an SRAM circuit and an FPGA chip are provided. The power management system includes a power management, a power management controller and an oscillator. The power management circuit include a power-on reset circuit used to determine whether powering-on of a core voltage and an analog input-output voltage of power supply voltages of the power management circuit is completed. The power management controller and the oscillator are used to control the power management circuit to power on the SRAM circuit after the power-on reset circuit determines that the powering-on of the core voltage and the analog input-output voltage is completed, and further used to control the power management circuit to erase the SRAM circuit after the SRAM circuit is powered on. Powering-on sequences of various internal power supplies of the FPGA chip are clear, and power consumption of the FPGA chip can be reduced.

Abstract: A processing method for a FIFO memory. The FIFO memory comprises a data caching module and an address control module. The processing method comprises: an address control module receives an empty/full state signal of a data caching module (S200); and the address control module adjusts the read-write address difference of the data caching module (S300).

Abstract: A boundary scan test method and a storage medium are disclosed. The method can be capable of testing the connectivity of a pad having a direct connection to user logic. The method is preformed based on a scan test instruction to FPGA. According to the method of the invention, software configuration is performed in FPGA user logic with respect to a PAD to be tested, such that the PAD can be tested according to the configuration without the need to test or pass through PADs that do not need to be tested. The method shortens boundary scan chains, thereby enabling rapid and flexible boundary scan tests and improving test efficiency.

Abstract: Disclosed are a clock and data recovery circuit, method and apparatus. The circuit comprises a receiving module for receiving an analog signal; a first equalization module connected to the receiving module, the first equalization module comprising a first totalizer and a second totalizer; a first sampling module connected to an output end of the first totalizer, the first sampling module comprising a first edge sampler and a second edge sampler that are connected to the output end of the first totalizer, respectively; a second sampling module connected to an output end of the second totalizer; a data processing module connected to both the first sampling module and the second sampling module; a clock recovery module connected to the data processing module; and an output module connected to the clock recovery module. In the present application, by means of the manner, a phase can be adjusted using a bias voltage, thereby accurately recovering clock information.

Abstract: A parallel finite field multiplication device is disclosed. The device comprises M cascaded logic processing modules, each of which comprises four input ends and two output ends for carrying out different finite multiplication in different length. The device is calculated step by step through M cascaded logic processing modules according to the number of cascaded logic processing modules. In this device, M cascaded logic processing modules may be used, according to different numbers of the cascaded logic processing modules, in finite field multiplication of different lengths, without needing to carry out polynomial multiplication.

Abstract: A method and apparatus for constructing an FPGA chip top-level schematic, and a storage medium are disclosed. The method comprises: integrating several PRIM devices into one grid device; integrating several grid devices into one tile device; abstracting each tile device into a corresponding tile device symbol; according to a predefined interconnection requirement, constructing each tile device symbol into a tile interconnection line symbol of at least one corresponding form; and integrating several tile interconnection line symbols into a top-level schematic. By means of the method, a hierarchical design is used, such that multi-form tile interconnection line symbols can be realized, thereby improving the working efficiency of system integration, and improving the high reliability, verifiability and easy-iteration of system integration.

Abstract: A SerDes module clock network architecture comprises, a reference clock input port, a plurality of data transmission channels, several user logic interfaces, several frequency division branches and a phase locked loop. The reference lock input port receives an input clock and conveys the input clock to the phase locked loop, the phase locked loop receives the input lock and outputs a PLL output clock signal, the PLL output clock signal is conveyed to the plurality of data transmission channels, and the PLL output clock signal is conveyed to the frequency division branches, and after frequency division, user interface clocks are output and conveyed to the user logic interfaces. When the PLL output clock signal in a SerDes is provided to an internal dedicated channel, several frequency division branches are also divided, and after frequency division, the signal is output to the user logic interfaces for use by an FPGA.

Abstract: A fixed time-delay circuit of a high-speed interface is disclosed. The fixed time-delay circuit comprises: a counter circuit for generating a shift selection signal of any bit; a data selector circuit for receiving first parallel data signals and rearranging the first parallel data signals according to the shift selection signal and a first low-speed clock to obtain second parallel data signals; a clock selector circuit for selecting, according to the shift selection signal, one clock from multiple input clocks having different phases, for outputting, to form a second low-speed clock; and a synchronization circuit for synchronizing the second parallel data signals according to the second low-speed clock. According to the circuit, initialization alignment among multichannel data of the high-speed interface can be achieved.