Abstract: An electronic product test jig includes a key testing unit and a circuit testing unit. The key testing unit includes: an X-axis mechanical arm, a Y-axis mechanical arm, a depression mechanical arm that are connected in succession; wherein the X-axis mechanical arm; and a key depression test head disposed at one end of the depression mechanical arm. The X-axis mechanical arm, the Y-axis mechanical arm, and the depression mechanical arm are configured to drive the key depression test head to move and fall over key positions of a product under test so as to complete the test of keys through the key depression test head. A pressure sensor is disposed on the key depression test head.

Abstract: An electronic product test jig includes a key testing unit and a circuit testing unit. The key testing unit includes: an X-axis mechanical arm, a Y-axis mechanical arm, a depression mechanical arm that are connected in succession; wherein the X-axis mechanical arm; and a key depression test head disposed at one end of the depression mechanical arm. The X-axis mechanical arm, the Y-axis mechanical arm, and the depression mechanical arm are configured to drive the key depression test head to move and fall over key positions of a product under test so as to complete the test of keys through the key depression test head. A pressure sensor is disposed on the key depression test head.