Patents Assigned to Shimadzu Corp.
  • Patent number: 11103806
    Abstract: In a preparative separation-purification system for passing a solution containing a target component through a trap column 21 to capture the target component in the column 21, and for subsequently passing an eluting solvent through the column 21 to elute the captured component and collect it in a container, an outlet aperture 27 of the column 21 has a tapered shape whose sectional area is largest on a plane facing an inner space of the column 21 and decreases in the flowing direction of the liquid. A filter 26 for preventing deposition of the target component is also provided at the boundary between the inner space of the column 21 and a passage for discharging liquid from the inner space. By this configuration, clogging of the passage at the outlet end of the column 21 due to deposition of the target component is prevented.
    Type: Grant
    Filed: April 30, 2013
    Date of Patent: August 31, 2021
    Assignee: Shimadzu Corp.
    Inventors: Tomoyuki Yamazaki, Przemyslaw Stasica, Bob Boughtflower
  • Patent number: 6066492
    Abstract: A microorganism belonging to the genus Staphylococcus or the genus Streptomyces which is capable of degrading a polylactic acid resin. A method of degrading a polylactic acid resin including a step of culturing a microorganism capable of degrading a polylactic acid resin in a medium containing a polylactic acid resin. In particular, the microorganisms Streptomyces violaceusniger FERM BP-6110 and Streptomyces cyaneus FERM BP-6111 are used.
    Type: Grant
    Filed: January 20, 1999
    Date of Patent: May 23, 2000
    Assignees: Director-General of Agency of Industrial Science and Technology, Shimadzu Corp.
    Inventors: Yutaka Tokiwa, Hiroyuki Jikuya, Naoko Nagai
  • Patent number: 5677534
    Abstract: An infrared light beam, emitted from an infrared light source 4, arrives periodically and alternatively at a sample cell 1a and reference cell 1b through a rotating chopper 2. The beam, which travels through the sample cell 1a and reference cell 1b, is detected as a sample signal and reference signal by a detector 5. The chopper 2 has apertures 2a and 2a. Since the aperture 2a, which faces the sample cell 1a, and the aperture 2b, which faces the reference cell 1b, are each formed in an arc shape having a central angle of about 90 degrees, the amount of time for which the infrared light beam is emitted and not emitted to the sample cell 1b and the reference cell 1a are all about equal. Therefore, the non-dispersive infrared analyzer can obtain about twice the amount of information about the concentration of the gas to be measured than a conventional apparatus per one chopper rotation.
    Type: Grant
    Filed: May 15, 1996
    Date of Patent: October 14, 1997
    Assignee: Shimadzu Corp.
    Inventor: Katsuhiko Araya
  • Patent number: 5483071
    Abstract: A two-dimensional radiation detector for obtaining a radiographic image as converted into electric signals. The detector has a multi-layer structure including a scintilator, a translucent electrode film, a photoconductive film and a scan switch layer. The scan switch layer includes conductors arranged in matrix form and in contact with the photoconductive film, a plurality of FETs corresponding to the conductors arranged in matrix form, and a uniformly planar conductor for successively applying a bias voltage through the FETs to the matrix conductors row by row. Each FET has a drain electrode connected to one of the matrix conductors, a source electrode connected to the uniformly planar conductor, and a gate electrode connected to the drive circuit. The translucent electrode film includes column conductors corresponding to columns of the matrix conductors, each of the column conductors being connected to a signal reading line.
    Type: Grant
    Filed: June 28, 1994
    Date of Patent: January 9, 1996
    Assignees: Shimadzu Corp., Nippon Hoso Kyokai
    Inventors: Shiro Oikawa, Takayuki Takemoto, Tutomu Katou, Shirou Suzuki, Kenkichi Tanioka
  • Patent number: 5307155
    Abstract: A spectro photometer deflects a measuring beam off its original axis to pass through a long sample, and returns the measuring beam to its final direction after passing through the sample. The sample is guided along a path which is clear of a reference beam of the spectro photometer. This arrangement permits double-beam measurement of long samples, with good signal-to-noise ratio. Deflection is accomplished using a plurality of mirrors.
    Type: Grant
    Filed: January 31, 1992
    Date of Patent: April 26, 1994
    Assignee: Shimadzu Corp.
    Inventors: Osamu Ando, Katsumi Harada