Abstract: An object of the present invention is to provide a nonwoven fabric that makes it difficult to diffuse liquid in a plane direction and can absorb and transmit liquid in a spot manner, that is, a nonwoven fabric excellent in so-called spot absorbability. The nonwoven fabric according to the present invention is formed by mixing an artificial protein fiber and a hydrophobic synthetic fiber.
Abstract: A system in-package test inspection apparatus for measuring and evaluating the high-speed/high frequency characteristic of a system in-package through an electrode pad in which I/O terminals are formed on one side of an LSI package containing metallic wiring internally and plural LSI chips are stacked in multiple layers on the other face while electric connection between the LSI chip and the LSI package and the electric connection between the LSI chips are implemented, the system in-package test inspection apparatus comprising: a printed wiring substrate to which the I/O terminals of the system in-package are connected to enable transmission of high speed and high frequency signals; LSI chip driving means for driving the LSI chip; a contact probe having a contact electrode and for transmitting a high frequency signal; evaluation signal generating means for supplying a high frequency evaluation signal to the contact probe; output signal detecting means for detecting an output signal of the system in-package th
Type:
Grant
Filed:
April 19, 2005
Date of Patent:
August 19, 2008
Assignees:
National Institute of Advanced Industrial Science and Technology, Shinwa Corp. Ltd.
Abstract: A system in-package test inspection apparatus for measuring and evaluating the high-speed/high frequency characteristic of a system in-package through an electrode pad in which I/O terminals are formed on one side of an LSI package containing metallic wiring internally and plural LSI chips are stacked in multiple layers on the other face while electric connection between the LSI chip and the LSI package and the electric connection between the LSI chips are implemented, the system in-package test inspection apparatus comprising: a printed wiring substrate to which the I/O terminals of the system in-package are connected to enable transmission of high speed and high frequency signals; LSI chip driving means for driving the LSI chip; a contact probe having a contact electrode and for transmitting a high frequency signal; evaluation signal generating means for supplying a high frequency evaluation signal to the contact probe; output signal detecting means for detecting an output signal of the system in-package th
Type:
Application
Filed:
April 19, 2005
Publication date:
October 27, 2005
Applicants:
National Institute of Advanced Industrial Science and Technology, Shinwa Corp. Ltd.