Abstract: A system and method for imaging the characteristics of an object (2) having at least a first (2a) and a second (2b) layer. The object (2) is illuminated by means of incident light (4), and light (5b) reflected from the object (2) is detected by means of an imaging sensor (6) in which the detected light is converted into electrical charges, according to which a representation of the object (2) is created. Information on light scattered (5a) in the first layer (2a) and the second layer (2b) of the object (2) is obtained from the representation and this information is compared to stored information in order to detect defects on the object (2).

Abstract: The present invention relates to an imaging apparatus and method for measuring the three-dimensional characteristics of an object (1) using range data acquisition and analysis. The imaging apparatus comprises: means for configuring the range data acquisition and analysis before starting the measuring; means for creating an image of said object (1) by detecting reflected light from said object (1) using at least one sensor (5) comprising pixels; means for acquiring range data of said object (1) from the created image measured in sensor pixel units; means for calibrating the acquired range data from sensor pixel values to world-coordinates; means for rectifying the calibrated range data by re-sampling the range data onto a uniformly spaced grid; and, means for analyzing the calibrated and rectified range data in order to obtain the three-dimensional characteristics of said object (1).

Abstract: A system and method for imaging the characteristics of an object (2) having at least a first (2a) and a second (2b) layer. The object (2) is illuminated by means of incident light (4), and light (5b) reflected from the object (2) is detected by means of an imaging sensor (6) in which the detected light is converted into electrical charges, according to which a representation of the object (2) is created. Information on light scattered (5a) in the first layer (2a) and the second layer (2b) of the object (2) is obtained from the representation and this information is compared to stored information in order to detect defects on the object (2).