Abstract: A component inspection apparatus includes a component holder mounted on a compound slide structure. Two arrays of gauging elements are provided on a mutually perpendicularly movable slide. These arrays can be adjusted on the slide and each array includes a plurality of separate gauge elements movable by contact with the work and at least one linear transducer connected to each gauge element. In use, the slides are moved to a plurality of predetermined positions in a sequence. The displacements of the probe elements at each position are noted and compared with displacements obtained when the same sequence of positions is followed while a master componet is in the holder.