Patents Assigned to Sigmax Kabushiki Kaisha
  • Pattern recognition device
    Patent number: 5073952
    Abstract: Data which represents a border line of a region of a video image to be observed and which contains a large luminance difference compared with that of a defect to be detected is excluded in judgement when it belongs to a predetermined region so that it is possible to detect a minute defect or defects reliably even when a position of a workpiece is displaced from that of a master or when the border line of the workpiece is not coincident with that of the master due to a difference in size therebetween.
    Type: Grant
    Filed: September 7, 1988
    Date of Patent: December 17, 1991
    Assignee: Sigmax Kabushiki Kaisha
    Inventor: Masaharu Watanabe