Abstract: Apparatus, systems, and methods are provided for processing integrated circuit chip design. A three-dimensional Monte Carlo random-walk process may be applied to a cell in a hierarchical description of the layout of the chip to extract information regarding the cell. The information may include coupling resistance, capacitance, inductance, or combinations thereof. A neighborhood of the cell may be built and data correlated to the neighborhood may be stored. Such a technique may be applied from a bottom level to a top level of the hierarchical description of the chip layout.