Abstract: An electronic switching apparatus for use in automated test equipment. The electronic switching apparatus includes a transconducting device having source and drain regions where at least one of the source and drain regions is configured to be coupled to a voltage source. A voltage comparison means is coupled to the transconducting device for determining a relative magnitude of voltage applied to the source and drain regions and a multiplexer has an input coupled to the voltage comparison means for selecting a higher of the relative magnitudes of voltage. A gate adder having an input is coupled to an output of the multiplexer and an output is coupled to a gate of the transconducting device. The gate adder is configured to add a fixed voltage to the higher of the relative magnitudes of voltage. A bulk adder having an input is coupled to an output of the multiplexer and an output is coupled to a bulk of the transconducting device.