Abstract: An electron gun assembly generates an accelerated and sharply focused electron beam which is deflected in a predetermined path to impinge upon an extended split anode structure in a selected scanning pattern with approximately half the beam current impinging on each half of the split anode. A signal proportional to the difference between the two currents from each half of the split anode provides feedback control to the beam deflection system for constraining the beam to follow the fissure of the split anode. X-rays which are generated at the point of beam impingement on the split anode constitute a moving source of X-rays as the point of beam impingement travels in the selected pattern along the anode.