Abstract: An IC test handler having an IC constant temperature chamber 7 includes M plant IC holders 71 each having K surfaces, a planet holder arranging mechanism 72 and an intermittent rotation driving mechanism 73. The holders 71 are arranged in an annular array on the mechanism 72 and revolve around the shaft for the sun. The mechanism 73 intermittently rotates in a step of 360.degree./M so that when each holder 71 makes one rotation around the shaft for the sun, the number of rotations of each holder on its own shaft is {N.+-.(1/K)}, where N is an integer. An IC which was attached to one of the K surfaces of a holder during one stop period in the intermittent rotation is removed from the holder during another stop period after the mechanism 73 has been rotated around the sun for a time sufficient for the IC to be preheated for the temperature test.