Patents Assigned to SINTO S-PRECISION, LTD.
  • Measuring device with alignment and reference position for measurement object
    Patent number: 9921401
    Abstract: A measuring device includes: a placement unit that places thereon a measurement object; an alignment microscope that observes an area including a measurement reference position of the measurement object placed on the placement unit; an capturing unit that captures an image of the area including the measurement reference position observed by the alignment microscope; a detection unit that detects the measurement reference position based on image data of the image captured by the capturing unit; a reference coordinate creating unit that creates a reference coordinate system based on the measurement reference position detected by the detection unit; a specifying unit that specifies a predetermined measurement position of the measurement object in the reference coordinate system created by the reference coordinate creating unit; and a measuring unit that measures at least one of surface roughness and surface shape of the predetermined measurement position of the measurement object specified by the specifying unit
    Type: Grant
    Filed: August 11, 2016
    Date of Patent: March 20, 2018
    Assignee: Sinto S-Precision, Ltd.
    Inventors: Katsumi Kohno, Tatsuya Aoki
  • Measuring Device
    Publication number: 20170061645
    Abstract: A measuring device includes: a placement unit that places thereon a measurement object; an alignment microscope that observes an area including a measurement reference position of the measurement object placed on the placement unit; an capturing unit that captures an image of the area including the measurement reference position observed by the alignment microscope; a detection unit that detects the measurement reference position based on image data of the image captured by the capturing unit; a reference coordinate creating unit that creates a reference coordinate system based on the measurement reference position detected by the detection unit; a specifying unit that specifies a predetermined measurement position of the measurement object in the reference coordinate system created by the reference coordinate creating unit; and a measuring unit that measures at least one of surface roughness and surface shape of the predetermined measurement position of the measurement object specified by the specifying unit
    Type: Application
    Filed: August 11, 2016
    Publication date: March 2, 2017
    Applicant: SINTO S-PRECISION, LTD.
    Inventors: Katsumi Kohno, Tatsuya Aoki