Abstract: A system and method in accordance with the present invention determines optimal specification limits for product by utilizing the characterization values for parameters of a plurality of known good parts. The known good parts are proportioned based upon a desired yield. The proportioned known good parts are partitioned into to provide a subset. The parameters of the partitioned subset of known good parts are utilized to determine the specification limits of the product.

Abstract: A system in accordance with the present invention provides characterization information for semiconductor products. The system includes a plurality of data sources, each providing data pertaining to the products. A server is coupleable to each data source. A database is coupled to the server for storing data from the data sources. An automatic data collection engine at the server automatically collects data from the sources. A characterization engine resident at the server operates on the data to provide characterization information. A reporting application engine operable at the server generates characterization reports from the characterization information. The characterization reports are selectable.