Abstract: The present invention relates to a method capable of recognizing disease-related factors included in document data and extracting relations between the disease-related factors.

Abstract: A method and a system for controlling a lot risk score based dynamic lot measurement on the basis of equipment reliability index are provided. The method for controlling a measurement, according to an embodiment of the present invention, calculates an equipment reliability index of specific equipment for a specific process in semiconductor manufacturing, calculates a risk score of the specific equipment for the specific process on the basis of an equipment reliability index, and determines, on the basis of the risk score, whether to measure a semiconductor product processed by the specific equipment for the specific process. Therefore, differential quality monitoring and management is possible according to the equipment reliability index, a measuring instrument can be efficiently used, quality and yield can be improved through timely measurement, and management convenience can be increased through automatic and dynamic lot measurement control.

Abstract: Provided is a machine learning-based semiconductor manufacturing yield prediction system and method. A result prediction method according to an embodiment of the present invention comprises: learning different neural network models by classifying different types of data according to their types and respectively inputting the classified different types of data to the different neural network models; and predicting result values by classifying input data according to their types and respectively inputting the classified input data to different neural network models. Therefore, it is possible to apply different neural network models to respective data according to their types, thereby ensuring a neural network model having a structure appropriate for the characteristics of each type of data and thus accurately predicting a result value.

Abstract: Provided are a blockchain-based one ID service system and method, in an authentication method according to the embodiment of present invention, an authentication support server maps and registers a first ID issued by a first SP server to a first user and a first site of the first SP server, which is an issuing server, and, upon receiving the first ID from a second SP server, the authentication support server returns information on the first site mapped to the first ID to the second SP server. To this end, there is no need for a separate server configuration to perform an authentication procedure, and it is possible to lessen the burden of performing authentication for SPs.

Abstract: Provided is a system and method that generates an artificial intelligence workflow model in which image conversion, measurement, and image searches can be performed, by selecting/combining algorithms suitable for a workflow having been created/modified according to a subject area such as a display manufacturing process, and that conducts a simulation of the generated model. An explainable artificial intelligence modelling and simulation method according to an embodiment of the present invention comprises the steps of: designing an artificial intelligence workflow model once algorithms suitable for a workflow having been created/modified according to a subject area are selected from algorithms stored in advance; and conducting, when input information is input, a simulation of the artificial intelligence workflow model for the input information.

Abstract: A method and a system for controlling a lot risk score based dynamic lot measurement on the basis of equipment reliability index are provided. The method for controlling a measurement, according to an embodiment of the present invention, calculates an equipment reliability index of specific equipment for a specific process in semiconductor manufacturing, calculates a risk score of the specific equipment for the specific process on the basis of an equipment reliability index, and determines, on the basis of the risk score, whether to measure a semiconductor product processed by the specific equipment for the specific process. Therefore, differential quality monitoring and management is possible according to the equipment reliability index, a measuring instrument can be efficiently used, quality and yield can be improved through timely measurement, and management convenience can be increased through automatic and dynamic lot measurement control.

Abstract: A method and a system for sensing fine changes in processing/equipment measurement data are provided. A data change sensing method according to an embodiment of the present invention extracts a part on the basis of a statistical distribution of reference data and comparison data, calculates a target range on the basis of a specification, and discriminates data, included in the target range, among the extracted reference data and comparison data so as to determine data changes. Therefore, fine changes in measurement data for processing or equipment can be sensed in a manufacturing process, thereby enabling pre-estimation of potential quality variability of products and quick preemptive actions for preventing quality degradation.

Abstract: Provided are a blockchain-based one ID service system and method, in an authentication method according to the embodiment of present invention, an authentication support server maps and registers a first ID issued by a first SP server to a first user and a first site of the first SP server, which is an issuing server, and, upon receiving the first ID from a second SP server, the authentication support server returns information on the first site mapped to the first ID to the second SP server. To this end, there is no need for a separate server configuration to perform an authentication procedure, and it is possible to lessen the burden of performing authentication for SPs.

Abstract: Provided is a method and system for determining a complex situation according to the time flow of events occurring in each device. In a method for determining a complex situation according to an embodiment of the present invention, a current situation is determined by detecting events occurring in devices and referring to a complex situation determination rule. The complex situation determination rule is a rule in which the current situation is mapped according to the events, which have occurred in the devices, and time intervals between the events. The present invention enables a more reliable determination of the current situation by complexly considering not only the events occurring in the devices but also time intervals between the events.

Abstract: A method and a system for providing a virtual semiconductor product replicating a real semiconductor product are provided. The method for providing the virtual semiconductor product according to an exemplary embodiment of the present disclosure includes: obtaining data which is used for manufacturing a real semiconductor; virtually producing a semiconductor product using the obtained manufacturing data; and providing the virtually produced virtual semiconductor product. Accordingly, the virtual semiconductor product replicating the real semiconductor product is provided in real time with real processing steps, such that time and expense required to measure and examine a semiconductor product can be minimized and a delay in producing semiconductor products is not caused.

Abstract: Provided is a machine learning-based semiconductor manufacturing yield prediction system and method. A result prediction method according to an embodiment of the present invention comprises: learning different neural network models by classifying different types of data according to their types and respectively inputting the classified different types of data to the different neural network models; and predicting result values by classifying input data according to their types and respectively inputting the classified input data to different neural network models. Therefore, it is possible to apply different neural network models to respective data according to their types, thereby ensuring a neural network model having a structure appropriate for the characteristics of each type of data and thus accurately predicting a result value.

Abstract: A method and a system for sensing fine changes in processing/equipment measurement data are provided. A data change sensing method according to an embodiment of the present invention extracts a part on the basis of a statistical distribution of reference data and comparison data, calculates a target range on the basis of a specification, and discriminates data, included in the target range, among the extracted reference data and comparison data so as to determine data changes. Therefore, fine changes in measurement data for processing or equipment can be sensed in a manufacturing process, thereby enabling pre-estimation of potential quality variability of products and quick preemptive actions for preventing quality degradation.

Abstract: A method and a system for analyzing a measurement-yield correlation are provided. The method for analyzing a measurement-yield correlation according to an embodiment of the present invention derives a first yield prediction function by using measurement-yield data which are data pairs of process result data measured after performing a process and actual yield data for each of the collected process result data, extracts some of the measurement-yield data by using a first yield prediction function, and subsequently derives a second yield prediction function by using the extracted measurement-yield data. As such, the measurement-yield correlation indicating high correlation/reliability can be derived, so that a final yield can be predicted relatively accurately from the process result data measured after performing the process.

Abstract: A method and a system for providing a virtual semiconductor product replicating a real semiconductor product are provided. The method for providing the virtual semiconductor product according to an exemplary embodiment of the present disclosure includes: obtaining data which is used for manufacturing a real semiconductor; virtually producing a semiconductor product using the obtained manufacturing data; and providing the virtually produced virtual semiconductor product. Accordingly, the virtual semiconductor product replicating the real semiconductor product is provided in real time with real processing steps, such that time and expense required to measure and examine a semiconductor product can be minimized and a delay in producing semiconductor products is not caused.

Abstract: Provided is a method and system for determining a complex situation according to the time flow of events occurring in each device. In a method for determining a complex situation according to an embodiment of the present invention, a current situation is determined by detecting events occurring in devices and referring to a complex situation determination rule. The complex situation determination rule is a rule in which the current situation is mapped according to the events, which have occurred in the devices, and time intervals between the events. The present invention enables a more reliable determination of the current situation by complexly considering not only the events occurring in the devices but also time intervals between the events.

Abstract: A removable tray integrated smart card and a mobile terminal adopting the same are provided. The smart card includes: a case configured to be removable into/from a smart card insertion slot of a mobile terminal; and a secure element provided in the case, wherein the case is removable into/from the smart card insertion slot without being placed on a tray. Accordingly, the smart card such as a USIM-card can be inserted into the mobile terminal without using the tray. In addition, since the size of the smart card increases as the smart card is unified with the tray, many high performance antennas and wireless modules can be inserted into the smart card and thus wireless communication performance of the smart card can be enhanced.

Abstract: A communication interface method for an SE equipped on a mobile terminal and an SE using the same are provided. The communication interface method includes: connecting, by a communication manager installed in an SE equipped on a mobile terminal, to a server via the mobile terminal; and executing, by the communication manager, communication processes between an applet which is installed in the SE separately from the communication manager, and the server. Accordingly, since the communication processes between the applet and the server are executed by the separate communication manager other than the applet, the processing function is omitted from the applets so that the applets can be simplified.

Abstract: There is provided a novel carbamoyloxy arylalkan arylpiperazine derivative compound having abundant racemic or enantiomeric characteristics, represented by the formula 1, and pharmaceutically available salts or hydrates thereof. Also, there are provided a pharmaceutical composition for treating pain (i.e., acute or chronic pain, neuropathic pain, inflammatory pain, diabetic pain, postherpetic neuralgia, etc.), anxiety or depression including an effective amount of the compound, and a method for treating pain, anxiety or depression in mammals by administering an effective amount of the compound to the mammals in need of treatment thereof.

Abstract: The invention is directed to a method of treating bipolar disorder in a subject, comprising administering a therapeutically effective amount of a carbamate compound, or pharmaceutically acceptable salt or amide thereof.

Abstract: The invention is directed to a method of treating restless legs syndrome in a subject, comprising administering a therapeutically effective amount of a carbamate compound, or pharmaceutically acceptable salt or amide thereof.