Patents Assigned to SMT, Inc.
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Patent number: 12056894Abstract: A method images a region of interest of a sample using a tomographic X-ray microscope. The method includes registering a position of the sample. Registering includes: imaging a portion of the sample containing a feature using the microscope, identifying the feature by matching the feature to a pre-recorded feature, and determining a relative position of the feature in relation to the pre-recorded feature. The method also includes navigating a field of view of the microscope over the region of interest based on the registered position of the sample, and imaging the region of interest using the microscope.Type: GrantFiled: September 9, 2021Date of Patent: August 6, 2024Assignee: Carl Zeiss SMT, Inc.Inventors: Thomas Anthony Case, Susan Candell, Naomi Kotwal, Allen Gu, Lorenz Lechner, Wayne Broderick
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Patent number: 12007339Abstract: A sample holder for holding a sample during an X-ray imaging process includes a sample placement surface on which the sample is placed for positioning the sample in a depth direction of the sample holder. The sample holder also includes a first alignment portion for aligning the sample in a width direction of the sample holder, and a second alignment portion for aligning the sample in a height direction of the sample holder.Type: GrantFiled: September 9, 2021Date of Patent: June 11, 2024Assignee: Carl Zeiss SMT Inc.Inventors: Thomas Anthony Case, Susan Candell, Naomi Kotwal, Allen Gu, Zheren Wu, Wayne Broderick
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Publication number: 20120104796Abstract: A trailer floor assembly includes a pair of longitudinally extending side rails supporting a plurality of self-mating transverse panels. The plurality of transverse panels includes extruded aluminum panels interspersed with roll-formed steel panels at locations where extra strength is desired (e.g., king pin, landing dollies, and rear door). The extruded panels include T-shaped slots in a bottom wall thereof to allow the extruded panels to be fastened to the side rails by fasteners engaging the bottom wall of the panel but not the top wall the panel. The assembly eliminates transverse cross-beams used to support longitudinal panels in the prior art, and thereby provides improved aerodynamics.Type: ApplicationFiled: October 30, 2010Publication date: May 3, 2012Applicant: SAMUEL SMT INC.Inventors: Richard M. Balaz, William A. Willsher, Emad Fakhry Habib Assaad
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Publication number: 20110049364Abstract: Methods disclosed herein include: (a) forming a channel in a sample, the channel extending one micron or more along a direction oriented at an angle to a surface of the sample; (b) exposing a portion of the sample above the channel to a particle beam to cause particles to leave the surface of the sample; and (c) forming an image of the sample based on particles that leave the surface.Type: ApplicationFiled: February 13, 2009Publication date: March 3, 2011Applicant: Carl Zeiss SMT Inc.Inventors: Rainer Knippelmeyer, Nicholas Economou, Mohan Ananth, Lewis A. Stern, Bill DiNatale, Lawrence Scipioni, John A. Notte, IV
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Publication number: 20110001058Abstract: Coated tips, as well as related articles, systems and methods are disclosed.Type: ApplicationFiled: August 26, 2010Publication date: January 6, 2011Applicant: Carl Zeiss SMT Inc.Inventor: John A. Notte, IV
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Patent number: 7767010Abstract: The present invention provides compositions for application to a material, such as building materials, prior to an exposure of the material to fire, or prior to, during or after exposure of the material to conditions favorable to the growth of microbes. When compositions within the present invention are properly applied to a material, they have the effect of reducing the amount of burning that occurs to the material, and/or reducing the amount or density of smoke and associated toxic gases produced by the material, when the material is exposed to fire, and inhibiting the growth of microbes on the material when the material is exposed to conditions favorable to the growth of microbes. The invention also provides methods for reducing the burning of a material that is exposed to fire, and for inhibiting the growth of microbes on a material exposed to conditions favorable to the growth of microbes.Type: GrantFiled: March 19, 2004Date of Patent: August 3, 2010Assignee: SMT, Inc.Inventors: Jon Lee Curzon, Thomas William Smoot
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Publication number: 20100136255Abstract: Charged particle sources, systems and methods are disclosed.Type: ApplicationFiled: November 25, 2009Publication date: June 3, 2010Applicant: CARL ZEISS SMT INC.Inventors: John A. Notte, IV, Lawrence Scipioni, Billy W. Ward, William B. Thompson
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Publication number: 20100052697Abstract: Methods and systems for defect repair are disclosed. The methods include: (a) identifying a defect causing an absence of an electrical connection between a first circuit element and a second circuit element, the first and second circuit elements being positioned in or on a substrate and the defect being positioned in the substrate; (b) removing a portion of the substrate to expose the defect, and depositing a conductive material to electrically connect the first and second circuit elements; and (c) verifying that the defect caused the absence of an electrical connection between the first and second circuit elements.Type: ApplicationFiled: August 28, 2009Publication date: March 4, 2010Applicant: CARL ZEISS SMT INC.Inventors: Rainer Knippelmeyer, Christoph Riedesel, John Morgan, Lawrence Scipioni
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Publication number: 20100051805Abstract: Ion microscope methods and systems are disclosed. In general, the systems and methods provide high ion beam stability.Type: ApplicationFiled: August 27, 2009Publication date: March 4, 2010Applicant: CARL ZEISS SMT INC.Inventors: FHM-Faridur Rahman, Louis S. Farkas, III, John A. Notte, IV
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Publication number: 20100012839Abstract: Disclosed are charged particle systems that include a tip, at least one gas inlet configured to supply gas particles to the tip, and a element having a curved surface positioned to adsorb un-ionized gas particles, and to direct desorbing gas particles to propagate toward the tip. The charged particle systems can include a field shunt connected to the tip, and configured to adjust an electric field at an apex of the tip.Type: ApplicationFiled: June 29, 2009Publication date: January 21, 2010Applicant: CARL ZEISS SMT INC.Inventors: John A. Notte, IV, Randall Percival, Colin A. Sanford, Alexander Grohloski
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Publication number: 20100012837Abstract: Charged particle beams with different charged particle currents are disclosed. In some embodiments, a method includes exposing a sample to a first ion beam having a first ion current at the sample, and exposing the sample to a second ion beam having a second ion current at the sample, where the first ion current is at least two times greater than the second ion current. In certain embodiments, a method includes creating a first ion beam at a first pressure, exposing a sample to the first ion beam, creating a second ion beam at a second pressure, and exposing the sample to the second ion beam, where the first pressure is at least two times greater than the second pressure.Type: ApplicationFiled: June 29, 2009Publication date: January 21, 2010Applicant: CARL ZEISS SMT INC.Inventors: John A. Notte, IV, Billy W. Ward
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Publication number: 20090314939Abstract: Disclosed herein are methods that include: (a) exposing a sample in a chamber to a first gas, where the first gas reacts with surface contaminants on the sample to form a second gas; (b) removing at least a portion of the second gas from the chamber; and (c) exposing the sample to a charged particle beam to cause a plurality of particles to leave the sample and detecting at least some of the plurality of particles. The charged particle beam can include particles having a molecular weight of 40 atomic mass units or less.Type: ApplicationFiled: May 21, 2009Publication date: December 24, 2009Applicant: Carl Zeiss SMT Inc.Inventors: Lewis A. Stern, Louis S. Farkas, III, Billy W. Ward, William DiNatale, John A. Notte, IV, Lawrence Scipioni
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Publication number: 20040173783Abstract: The present invention provides combined property, dual-action compositions for application to a material, such as Gypsum Wall Board, ceiling tiles, joint compounds, concrete and other interior building materials, prior to an exposure of the material to fire, or prior to, during or after exposure of the material to conditions favorable to the growth of microbes. When compositions within the present invention are properly applied to a material prior to the material being exposed to fire, or prior to, during or after the material being exposed to conditions favorable to the growth of microbes, these compositions have the effect of reducing the amount of burning that occurs to the material, and/or reducing the amount or density of smoke and associated toxic gases produced by the material, when the material is exposed to fire.Type: ApplicationFiled: March 19, 2004Publication date: September 9, 2004Applicant: SMT, Inc.Inventors: Jon Lee Curzon, Thomas William Smoot
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Publication number: 20030170317Abstract: The present invention provides combined property, dual-action compositions for application to a material, such as Gypsum Wall Board, ceiling tiles, joint compounds, concrete and other interior building materials, prior to an exposure of the material to fire, or prior to, during or after exposure of the material to conditions favorable to the growth of microbes. When compositions within the present invention are properly applied to a material prior to the material being exposed to fire, or prior to, during or after the material being exposed to conditions favorable to the growth of microbes, these compositions have the effect of reducing the amount of burning that occurs to the material, and/or reducing the amount or density of smoke and associated toxic gases produced by the material, when the material is exposed to fire.Type: ApplicationFiled: April 5, 2003Publication date: September 11, 2003Applicant: SMT, Inc.Inventors: Jon Lee Curzon, Thomas William Smoot