Abstract: An X-ray gas detector for analyzing a material by studying X-ray diffraction. In order to minimize the parallax error without resorting to auxiliary electrodes, difficult to manufacture, a radial field in the whole gas space (40) is generated only by means of input electrodes (36) set to appropriate voltages and by means of lateral electrodes (44) also individually set to appropriate voltages. By modifying the voltages, it is also possible to move the center of the spheric equipotentials for permitting the analysis without parallax error of samples (20) placed at variable distances (D) from mthe input window (32) of the detector.
Type:
Grant
Filed:
April 27, 1989
Date of Patent:
September 4, 1990
Assignees:
Centre National de la Recherche Scientifique, Societe Inel
Inventors:
Vincent Comparat, Jean Ballon, Pierre Carrechio, Alain Pelissier