Abstract: Reference oscillators are ubiquitous in timing applications generally, and in modern wireless communication devices particularly. Microelectromechanical system (MEMS) resonators are of particular interest due to their small size and potential for integration with other MEMS devices and electrical circuits on the same chip. In order to support their use in high volume low cost applications it would be beneficial for MEMS designers to have MEMS resonator designs and manufacturing processes that whilst employing low cost low resolution semiconductor processing yield improved resonator performance thereby reducing the requirements of the oscillator circuitry. It would be further beneficial for the oscillator circuitry to be able to leverage the improved noise performance of differential TIAs without sacrificing power consumption.

Abstract: Orbital angular momentum (OAM) based photonics promises researchers and systems designers with a new degree of freedom whilst offering annular intensity distributions rather than Gaussian intensity distributions. However, absence of an optical fiber design that not only supports propagation of OAM signals and cylindrical vector modes but does so with a large design space for designers to adjust and tune the modal properties of the optical fiber supporting these OAM signals has hampered developments. Embodiments of the invention exploit photonic crystal fiber designs to support this design/manufacturing tunability whilst also supporting “endlessly single-radial order” modal regimes where the optical fiber is mono-annular over a wide range of optical wavelengths. Such optical fibers being able to support the transmission of a larger diversity of mono-annular modes (OAM or vector modes in nature, or otherwise) in a reliable manner and over a wider range of wavelengths than conventional silica optical fibers.

Abstract: A system and method for testing the data propagation time in an integrated circuit at relatively low speed is described herein. The method uses at least two parallel circuits comprising a data circuit and a clock circuit, wherein these parallel circuits are provided with at least one inverter for sensing the feeding current of each circuit so as to obtain current pulses that are transformed into binary signals forwarded to a tester that measures the delay time between these signals.