Patents Assigned to Socrat
  • Patent number: 6825670
    Abstract: The present invention relates to a method for testing a conductor element (20) applicable to locating a continuity defect of the conductor element, the conductor element having, relative to a reference conductor, an insulation resistance and a leak capacitance. According to the present invention, the method comprises a step of injecting into the conductor element at least two currents (i1, i2) of different frequencies by means of a current or voltage generator (23), one terminal of which is connected to the reference conductor, at least one step of measuring the amplitudes of currents at one measuring point (Pi) chosen along the conductor element, and a step of calculating the imaginary part of currents and/or calculating the leak capacitance of the conductor element downstream from the measuring point (P1).
    Type: Grant
    Filed: July 15, 2002
    Date of Patent: November 30, 2004
    Assignee: Socrat
    Inventor: Jean Bussinger
  • Patent number: 6538450
    Abstract: Method for locating an insulation fault (Rd) in the screen (SCR) of a cable relative to the ground, the screen being electrically accessible at least at one point of origin (Po) and at one terminal point (Pe). A current is injected between the point of origin (Po) and the terminal point (Pe) of the screen (SCR), by a current or voltage generator (21) that is insulated from the ground, a first electric voltage (U1) is measured at the point of origin (Po), in reference to the ground, and a second electric voltage (U, U2) is measured at the terminal point (Pe). The ratio between the first (U1) and the second (U, U2) voltages measured is representative of the relative position (Pdr) of the insulation fault between the point of origin (Po) and the terminal point (Pe).
    Type: Grant
    Filed: March 28, 2001
    Date of Patent: March 25, 2003
    Assignee: Socrat
    Inventor: Jean Bussinger
  • Publication number: 20030042913
    Abstract: The present invention relates to a method for measuring the electrical characteristics of a telecommunication cable (10) comprising a bundle of electric wires (11) conveying a service voltage (U) delivered by equipment (15) referenced to ground, arranged in an insulating sheath comprising a conductive screen (12). According to the present invention, the method comprises one step of measuring the insulation resistance (Riso) of the screen (12) relative to the ground, one step of measuring the electric potential (Pe) of the screen (12) relative to the ground, and one step of determining a global insulation resistance (Ri) of the bundle of electric wires (11) relative to the conductive screen (12), using the result of the measurements of the insulation resistance (Riso) and of the electric potential (Pe) of the screen. Application to characterising or to maintaining telecommunication cables.
    Type: Application
    Filed: August 23, 2002
    Publication date: March 6, 2003
    Applicant: SOCRAT
    Inventor: Jean Bussinger
  • Publication number: 20030006780
    Abstract: The present invention relates to a method for testing a conductor element (20) applicable to locating, a continuity defect of the conductor element, the conductor element having, relative to a reference conductor, an insulation resistance and a leak capacitance. According to the present invention, the method comprises a step of injecting into the conductor element at least two currents (i1, i2) of different frequencies by means of a current or voltage generator (23), one terminal of which is connected to the reference conductor, at least one step of measuring the amplitudes of currents at one measuring point (Pi) chosen along the conductor element, and a step of calculating the imaginary part of currents and/or calculating the leak capacitance of the conductor element downstream from the measuring point (P1).
    Type: Application
    Filed: July 15, 2002
    Publication date: January 9, 2003
    Applicant: Socrat
    Inventor: Jean Bussinger