Patents Assigned to Sof-Tek Integrators, Inc. dba as Op-Test
  • Publication number: 20140268152
    Abstract: Embodiments as disclosed herein provide a method and system that characterizes physical properties, such as thickness, uniformity, polarization, and/or sizes and locations of defect (e.g. defect density distribution) of crystalline structures grown on or thin films deposited on a substrate of a solid state light emitting device. The embodiments disclosed herein generally include exciting the light emitting device with an energy source and analyze optical energy emitted by the crystalline structures grown on or the thin films deposited on the substrate.
    Type: Application
    Filed: March 11, 2014
    Publication date: September 18, 2014
    Applicant: Sof-Tek Integrators, Inc. dba as Op-Test
    Inventors: Daniel C. MORROW, Jonathan DUMMER, Stanley Curtis DODDS
  • Publication number: 20140088910
    Abstract: A system and method of testing High Brightness LED (HBLED) is provided, and more particularly, a system and method of Controlled Energy Testing of HBLED with improved accuracy and repeatability is provided. In one embodiment, the system includes a programmable constant power source for providing a constant power to a Device Under Test (DUT), in this case, an HBLED, wherein the programmable constant power source adjusts an output voltage or an output current to ensure that a given amount of power is supplied to the HBLED for a predetermined amount of time and to provide precise control of a junction temperature of the HBLED for the duration of the test sequences; a Parametric Measurement Unit (PMU) including a processor for executing a plurality of HBLED test sequences, and a spectrometer for measuring a set of HBLED parameters including power and color (wavelength) of an optical output of the HBLED; and a controller for coordinating timing of acquiring the set of measured HBLED parameters.
    Type: Application
    Filed: November 25, 2013
    Publication date: March 27, 2014
    Applicant: Sof-Tek Integrators, Inc. dba Op-Test
    Inventors: Daniel Creighton Morrow, Jonathan Leigh Dummer
  • Publication number: 20120038363
    Abstract: A system and method of quantifying color and intensity of light sources including LEDs, HBLEDs (High Brightness LEDs), and other Solid State Lights (SSLs) using C-parameters to model a Spectral Power Distribution (SPD) to improve precision, accuracy, repeatability and usefulness of measurement of optical properties of wavelength and radiant flux in manufacturing of an object, designing products and processes that use the object, and describing/defining the object, is provided.
    Type: Application
    Filed: August 8, 2011
    Publication date: February 16, 2012
    Applicant: Sof-Tek Integrators, Inc. dba Op-Test
    Inventors: Daniel Creighton Morrow, Jonathan Leigh Dummer