Abstract: Testing of an electronic component (1) in which a signal (S1) is sent to a cell (3) of the component, and the output signal (S2) of this component is studied so as to define whether the component is acceptable or not. If the component is acceptable the test is performed again by sending a signal (S1′) similar to the first signal but with a shorter duration (T2). A search is then made for an output signal (S2′) to be compared with a compressed expected pattern. If this test, which is performed more rapidly, is valid, it can be planned, if necessary, to use this faster input signal on following components to be tested.

Abstract: A method for the testing of electronic components comprises an interface driving a test device. The interface can be parameterized according to the test. The test method provides for a first and only learning phase during which a measurement date that is the earliest possible date is determined. This method thereafter comprises the performance of adjusting phases to define adjusted measurement dates, used during an application phase. The adjusting phases are short, fast and precise, and are used to optimize the total performance time of a test and, simultaneously, also the profitability of production. Indeed, the measurement dates are determined with respect to the totalized populations.

Abstract: A device (1) has a processor (13) capable of controlling test equipment (2) to carry out repeatedly at least some of its steps, each time reducing the duration of at least one of the steps until satisfying a final criterion taking into account the distribution of the electric variables measured by the equipment for each reduced duration value, and to set a new duration value at most equal to its initial value, for which the measured electric variable distribution satisfies one selected dispersion condition. The device has a function generator (14) capable of providing a function applicable to at least one of the terms of a comparison executed during one of the steps, so that the function operates on a measurement executed after the new duration.