Abstract: Methods of characterizing subsurface conditions in a selected geographic region previously associated as a whole with a specific subsurface material characteristic reference profile such as from a USDA-NRCS soil survey. The method includes deploying a sensing tool at selected positions within the geographic region to determine a depth-referenced subsurface material characteristic such as soil type or strata, comparing the determined subsurface material characteristic to the subsurface material characteristic reference profile associated with the geographic region to determine a correlation between the subsurface material characteristic reference profile and the depth-referenced subsurface material characteristic, and then deciding whether to deploy the tool at another position, and at what optimum position to deploy the tool, by considering the correlation.
Type:
Grant
Filed:
May 13, 2003
Date of Patent:
October 25, 2005
Assignee:
Soil and Topography Information, LLC
Inventors:
Daniel James Rooney, Marek Dudka, Mark Andrew Cheyne
Abstract: Methods of characterizing subsurface conditions in a selected geographic region previously associated as a whole with a specific subsurface material characteristic reference profile such as from a USDA-NRCS soil survey. The method includes deploying a sensing tool at selected positions within the geographic region to determine a depth-referenced subsurface material characteristic such as soil type or strata, comparing the determined subsurface material characteristic to the subsurface material characteristic reference profile associated with the geographic region to determine a correlation between the subsurface material characteristic reference profile and the depth-referenced subsurface material characteristic, and then deciding whether to deploy the tool at another position, and at what optimum position to deploy the tool, by considering the correlation.
Type:
Application
Filed:
May 13, 2003
Publication date:
October 23, 2003
Applicant:
Soil and Topography Information, LLC, a Wisconsin corporation
Inventors:
Daniel James Rooney, Marek Dudka, Mark Andrew Cheyne
Abstract: Methods of characterizing subsurface conditions in a selected geographic region previously associated as a whole with a specific subsurface material characteristic reference profile such as from a USDA-NRCS soil survey. The method includes deploying a sensing tool at selected positions within the geographic region to determine a depth-referenced subsurface material characteristic such as soil type or strata, comparing the determined subsurface material characteristic to the subsurface material characteristic reference profile associated with the geographic region to determine a correlation between the subsurface material characteristic reference profile and the depth-referenced subsurface material characteristic, and then deciding whether to deploy the tool at another position, and at what optimum position to deploy the tool, by considering the correlation.
Type:
Grant
Filed:
November 1, 2001
Date of Patent:
July 22, 2003
Assignee:
Soil and Topography Information, LLC
Inventors:
Daniel James Rooney, Marek Dudka, Mark Andrew Cheyne