Abstract: A dental analyzer for analyzing dental implants includes a dental probe having a probe tip for contacting a patient's dental implant. An accelerometer is coupled to the probe tip. A hammer fired by an actuator against the accelerometer impacts the probe tip against the dental implant which vibrates the dental implant. The accelerometer measures the acceleration time history of the vibrating dental implant. A processor converts the measured acceleration time history of the dental implant into a frequency spectrum from which a diagnosis can then be made regarding the condition of the dental implant.