Abstract: The invention relates to a method and a spectrometer for wavelength-dependent measurement of radiation in the range of UV light and visible light, with an entry gap, a dispersive element and a number of sensors comprising pixels, wherein a light path runs inside the spectrometer from the entry slot to the sensors and an imaging element is provided, which focusses the radiation on the sensors, in the case of which a means for defocussing the radiation is provided, which is activatable for the purpose of calibration.

Abstract: A spectrometer may include a radiation source having a spark generator, an entrance slit, a dispersive element and a plurality of detectors, and a rotatable sector shutter having an axis of rotation and a trigger unit optically coupled to the sector diaphragm. The axis of rotation of the sector shutter is non-parallel to a connecting line between the source and the entrance slit.

Abstract: An arrangement for optical emission spectrometry with a spectrochemical source, which during operation emits non-directed radiation, and with a spectrometer having at least one entry aperture arranged at a side next to the source, at least one dispersive element and at least one detector, which are arranged such that during operation part of the radiation emitted in the direction of the entry aperture from the source enters the spectrometer through the entry aperture, from the entry aperture falls indirectly or directly on the dispersive element(s), is split up according to wavelengths and is registered by the at least one detector. A mirror may be arranged at a side of the source opposed to the entry aperture at a distance from the source to reflect at least one part of the radiation, not emitted in the direction of the entry aperture from the source, in the direction of the entry aperture.

Abstract: An optical emission spectrometry instrument may comprise an inductively coupled plasma generator (ICP) with an electromagnetic coil having input and ground connectors. The electromagnetic coil may be mounted to a mounting disk, and the input connector may be coupled to a power output of a radio frequency power source, and the ground connector may be connected to the mounting disk. A spectro-chemical source may be used for sample excitation. The spectro-chemical source and the ICP may have a longitudinal axis. An optical system may be included for viewing the spectro-chemical source with a fixed view axis. The electromagnetic coil may be mounted pivotably around one of its connectors so that the orientation of the ICP can be altered from a first orientation of its longitudinal axis to a second orientation of its longitudinal axis, and vice versa.

Abstract: A method for compensating spectrum drift in a spectrometer having a radiation source, optical apparatus to split up a spectrum into spectral lines according to wavelengths of radiation from the radiation source, a number of detectors to receive partial spectra, and which are provided with respective pluralities of pixels to measure radiation intensity, and a catalog of spectral lines of different chemical elements that may be used as correction lines. The method may include generating and recording an emission spectrum of a sample; determining pixels receiving the maximum of the peaks for respective partial spectra and identifying respective peak positions for the peak maxima; for the respective peak positions, determining if there is a correction line within a predetermined maximum distance from the peak position, and if so, calculating a distance between the peak position and the correction line; and calculating a correction function for assignment of peak positions.

Abstract: A spectrometer for examining the spectrum of an optical emission source may include: an optical base body, a light entry aperture connected to the optical base body to couple light into the spectrometer, at least one dispersion element to receive the light as a beam of rays and generate a spectrum, and at least one detector for measuring the generated spectrum. A light path may run from the light entry aperture to the detector. A mirror group with at least two mirrors may be provided in a section of the light path between the light entry aperture and the at least one detector, in which the beam does not run parallel, which may compensate for temperature effects. In the mirror group, at least one mirror or the entire mirror group may be moveable relative to the optical base body and may be coupled to a temperature-controlled drive.

Abstract: An inorganic mass spectrometer capable of measuring a relevant and large or the full mass spectral range simultaneously may include a suitable ion source (e.g., an ICP mass spectrometer with an ICP ion source), an ion transfer region, ion optics to separate ions out of a plasma beam, a Mattauch-Herzog type mass spectrometer with a set of charged particle beam optics to condition the ion beam before an entrance slit, and a solid state multi-channel detector substantially separated from ground potential and separated from the potential of the magnet.

Abstract: A method of determining the carbon content of an iron alloy may include starting of the measurement of a sample in a spark spectrometer, creation of a plasma in a pre-sparking phase, detection and recording of an intensity signal for the carbon, calculation and cutting out of an unstable plasma phase, calculation of an excessive rise in the carbon signal, and calculation of the content of dissolved and undissolved carbon.

Abstract: An inorganic mass spectrometer capable of measuring a relevant and large or the full mass spectral range simultaneously may include a suitable ion source (e.g., an ICP mass spectrometer with an ICP ion source), an ion transfer region, ion optics to separate ions out of a plasma beam, a Mattauch-Herzog type mass spectrometer with a set of charged particle beam optics to condition the ion beam before an entrance slit, and a solid state multi-channel detector substantially separated from ground potential and separated from the potential of the magnet.

Abstract: The invention relates to a spectrometer for analyzing the optical emission of a sample by means of pulsed excitation of an optical spectral emission, having an excitation source, a gap arrangement, at least one dispersive element and having detectors for the emitted spectrum, in which two beam paths are provided with two dispersive elements, the first dispersive element of which images the spectrum of the emission onto a number of spatially resolving detectors and the second dispersive element of which images the spectrum of the emission onto a number of time-resolving detectors.

Abstract: The invention relates to a spectrometer for analyzing the optical emission of a sample, having an excitation source, an entrance gap and a dispersive element, which fans out the spectrum of the light generated in the excitation source in a plane, and having solid body sensors with one or more lines, which are arranged in the region of the focal curve of the beam path in order to evaluate the spectral information, wherein the sensors are arranged above or below the plane and the spectral emission is deflected onto the sensors by mirrors and focused, wherein the reflecting surface of the mirrors is aspherically formed in a direction of curvature.

Abstract: A Plasma Emission Transfer and Modification Device allowing for alteration of the plasma shape or characteristics for e.g. optimized viewing of relevant Plasma zones or improved coupling of a Plasma to the subsequent spectrometer optics, at the same time avoiding negative effects (e.g. heat transfer from the spectro-chemical source into subsequent system components) is described.

Abstract: A Plasma Emission Transfer and Modification Device allowing for alteration of the plasma shape or characteristics for e.g. optimized viewing of relevant Plasma zones or improved coupling of a Plasma to the subsequent spectrometer optics, at the same time avoiding negative effects (e.g. heat transfer from the spectro-chemical source into subsequent system components) is described.

Abstract: A method of determining the carbon content of an iron alloy may include starting of the measurement of a sample in a spark spectrometer, creation of a plasma in a pre-sparking phase, detection and recording of an intensity signal for the carbon, calculation and cutting out of an unstable plasma phase, calculation of an excessive rise in the carbon signal, and calculation of the content of dissolved and undissolved carbon.

Abstract: An inorganic mass spectrometer capable of measuring a relevant and large or the full mass spectral range simultaneously may include a suitable ion source (e.g., an ICP mass spectrometer with an ICP ion source), an ion transfer region, an ion optics to separate ions out of a plasma beam, a Mattauch Herzog type mass spectrometer with a set of charged particle beam optics to condition the ion beam before the entrance slit, and a solid state multi channel detector substantially separated from ground potential and separated from the potential of the magnet is introduced.

Abstract: The invention relates to a method for the spectral analysis of metal samples with the following steps: a. Recording of a spectrum of an unknown sample with a number of preset excitation parameters, b. Comparison of the spectrum with stored spectra of a number of control samples, c. Determination of the control sample with the best concordance of spectra, d. Setting of the excitation parameters, which are stored for the best and closest control sample determined in step c, e. Recording of the spectrum of the unknown sample with the excitation parameters set in step d, f. Calculation of the intensity ratios of the analysis lines stored for the control sample and the internal standards of the spectrum recorded in step e.

Abstract: The invention relates to spectrometer optics with a beam path from a beam source to a number of electro-optical sensors without spatial resolution, the beam path comprising an entry slot, a dispersive element, and a number of exit slots arranged on a focal curve, wherein furthermore: a first actuator for changing the angle of incidence ? between the beam from the entry slot to the dispersive element and from the normal to the dispersive element; a number of second actuators for moving the exit slots tangentially with respect to the focal curve or in a peripheral direction along the focal curve and a controller which is adapted to control the first actuator and the second actuators to carry out a calibration is provided.

Abstract: The present invention relates to a method for correcting spectral interference in a spectrum which is determined using an inductively coupled plasma spectrometer (ICP) for analysing element contents of a liquid or gaseous sample, comprising the following steps: recording the spectrum of a matrix solution containing all spectrally interfering components, which are also contained in the sample, in a first concentration; recording the spectrum of the matrix solution in at least one dilution of the first concentration; regressing the signal intensities obtained in steps a. and b. against the concentration for a number of wavelength positions; calibrating the spectrometer, background correction using the values determined from the regression in step c. and determining the calibration function c=f(I); recording the sample spectrum using at least one analyte which is contained therein; determining the concentration of the spectrally interfering components in the sample using the results obtained in step c.

Abstract: The invention relates to a spectrometer for analysing the optical emission of a sample by means of pulsed excitation of an optical spectral emission, having an excitation source, a gap arrangement, at least one dispersive element and having detectors for the emitted spectrum, in which two beam paths are provided with two dispersive elements, the first dispersive element of which images the spectrum of the emission onto a number of spatially resolving detectors and the second dispersive element of which images the spectrum of the emission onto a number of time-resolving detectors.

Abstract: The invention relates to a spectrometer for analysing the optical emission of a sample, having an excitation source, an entrance gap and a dispersive element, which fans out the spectrum of the light generated in the excitation source in a plane, and having solid body sensors with one or more lines, which are arranged in the region of the focal curve of the beam path in order to evaluate the spectral information, wherein the sensors are arranged above or below the plane and the spectral emission is deflected onto the sensors by mirrors and focused, wherein the reflecting surface of the mirrors is aspherically formed in a direction of curvature.