Patents Assigned to Spectronic Instruments, Inc.
  • Patent number: 6067197
    Abstract: An echelle grating having a groove facet angle and groove periodicity such that for laser-emitted light of two different wavelengths the highest propagating diffraction order is blazed and the next higher order is non-propagating such that the intensity of each blazed order is enhanced. In an example, the 84th diffraction order of a KrF excimer laser emitting at 248.4 nm and the 108th diffraction order of an ArF excimer laser emitting at 193.3 nm will both be blazed when the groove spacing d is 0.010623 mm, corresponding to a frequency f of 94.13 grooves per mm, and the groove facet angle .theta..sub.g is about 80.degree., whereas the next higher order for each laser, i.e., the 85th and 109th orders, respectively, are non-propagating, and thus both blaze orders are enhanced.
    Type: Grant
    Filed: December 23, 1998
    Date of Patent: May 23, 2000
    Assignee: Spectronic Instruments, Inc.
    Inventors: Thomas C. Blasiak, Semyon L. Zheleznyak
  • Patent number: 5999318
    Abstract: An extra step for a conventional replica forming process for diffraction gratings used in lasers is described herein. Applicant has discovered that the deterioration of a replica diffraction grating, when used with intense laser light, is accelerated due to small quantities of the radiation leaking through minute fractures in the aluminum reflective coating. Applicant has identified the source of this problem as occurring during the removal of the replica from the master grating. Applicant's improvement to this conventional process is to deposit a thin reflective overcoat of aluminum on the surface of the replica after the replica has been removed from the master and cleaned. The overcoating is performed in a vacuum chamber by sputtering or evaporation. This overcoat is not subjected to any subsequent destructive forces and hence remains relatively opaque. A typical thickness of the overcoat is around 100 nm. An oxide layer is formed over the aluminum and a third layer of aluminum is formed over the oxide.
    Type: Grant
    Filed: March 9, 1999
    Date of Patent: December 7, 1999
    Assignees: Cymer, Inc., Spectronic Instruments, Inc.
    Inventors: Richard G. Morton, Thomas C. Blasiak
  • Patent number: 5815254
    Abstract: An apparatus and method are provided for selectively measuring color values of a transmittance sample in a transmittance mode and a reflectance sample in a reflectance mode. The spectrophotometer includes two light channels, a first light channel from a light source to a first detector and a second light channel from the same light source to a second detector. The light channels conduct the light through the spectrophotometer. The spectrophotometer includes appropriate circuitry to compare the light striking the first and second detectors to determine the color value of a sample. A transmittance cell is located in the first light channel for selectively receiving a transmittance sample. When a sample is present, light passing through the transmittance sample is altered because the sample selectively absorbs some of the wavelengths of light. The spectrophotometer also includes a reflectance measurement area in the second light channel for selectively receiving a reflectance sample.
    Type: Grant
    Filed: October 8, 1996
    Date of Patent: September 29, 1998
    Assignee: Spectronic Instruments, Inc.
    Inventor: Gary R. Greene
  • Patent number: 5774209
    Abstract: A hand-held portable spectrophotometer that is contained in an enclosed housing and includes a source of illumination and a spectrograph, along with a transmittance cell and a reflectance cell. The transmittance cell is adapted to receive therein either a solid sample or a liquid sample through an access door in the top wall of the housing.
    Type: Grant
    Filed: October 8, 1996
    Date of Patent: June 30, 1998
    Assignee: Spectronic Instruments, Inc.
    Inventor: Michael A. Shestock
  • Patent number: D392906
    Type: Grant
    Filed: October 8, 1996
    Date of Patent: March 31, 1998
    Assignee: Spectronic Instruments, Inc.
    Inventors: Michael A. Shestock, Gary R. Greene, Jason M. Avery