Patents Assigned to Spectrum External Line Inspection Technology Inc.
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Patent number: 8800739Abstract: A spooling apparatus includes a spool for holding wire, the spool having a wire-retaining section and end plates, the end plates having one or more apertures. A conductive plate is positioned on an end plate of the spool opposite the wire-retaining section, and at least one conductive extension that extends through a corresponding aperture of the end plate such that the conductive extension is adjacent to the wire retaining section. Wire is spooled onto the wire-retaining section, at least a portion of the wire being uninsulated and in electrical contact with the conductive extensions of the conductive plate.Type: GrantFiled: April 25, 2012Date of Patent: August 12, 2014Assignee: Spectrum External Line Inspection Technology Inc.Inventors: Shamus McDonnell, Gordon Lischuk
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Publication number: 20120273603Abstract: A spooling apparatus includes a spool for holding wire, the spool having a wire-retaining section and end plates, the end plates having one or more apertures. A conductive plate is positioned on an end plate of the spool opposite the wire-retaining section, and at least one conductive extension that extends through a corresponding aperture of the end plate such that the conductive extension is adjacent to the wire retaining section. Wire is spooled onto the wire-retaining section, at least a portion of the wire being uninsulated and in electrical contact with the conductive extensions of the conductive plate.Type: ApplicationFiled: April 25, 2012Publication date: November 1, 2012Applicant: SPECTRUM EXTERNAL LINE INSPECTION TECHNOLOGY, INC.Inventors: Shamus McDONNELL, Gordon LISCHUK
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Patent number: 7881890Abstract: A method of prioritizing anomalies in a linear conductor buried under a ground surface includes the steps of obtaining prioritization values for a plurality of anomalies along a linear conductor, and ranking the prioritization values according to magnitude. For each anomaly, a prioritization value is obtained by: locating an anomaly; for each anomaly, determining a current, a depth of cover, and a voltage gradient using spaced voltage probes; using the depth of cover and the voltage gradient, calculating an effective probe spacing of the first and second voltage probes relative to the anomaly on the conductor; and determining the prioritization value of the anomaly based on a linear relationship between the voltage gradient and the product of the current and the effective probe spacing.Type: GrantFiled: May 5, 2009Date of Patent: February 1, 2011Assignee: Spectrum External Line Inspection Technology Inc.Inventors: Shamus McDonnell, Mike Westman, Chijioke Ukiwe
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Patent number: 7697572Abstract: A multiplexer includes a body having a mechanism, incorporated into the body, for receiving more than one incoming data stream and converting the more than one data stream into a single output stream. An integral time clock is incorporated into the body and is adapted to incrementally time stamp each incoming data stream. The processor on the device also runs software to parse user selected data streams for the purpose of filtering out unnecessary data from the incoming streams, thereby reducing the volume of data and, in particular unwanted data, from being processed and/or logged from the device. The integration of a multimeter for voltage and amperage reading acquisition also reduces the need for external peripheral devices being attached to the device.Type: GrantFiled: December 7, 2006Date of Patent: April 13, 2010Assignee: Spectrum External Line Inspection Technology Inc.Inventors: Ken Smelquist, Robert Gagnon, Mike Westman, Grant Dakin
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Publication number: 20090281746Abstract: A method of prioritizing anomalies in a linear conductor buried under a ground surface includes the steps of obtaining prioritization values for a plurality of anomalies along a linear conductor, and ranking the prioritization values according to magnitude. For each anomaly, a prioritization value is obtained by: locating an anomaly; for each anomaly, determining a current, a depth of cover, and a voltage gradient using spaced voltage probes; using the depth of cover and the voltage gradient, calculating an effective probe spacing of the first and second voltage probes relative to the anomaly on the conductor; and determining the prioritization value of the anomaly based on a linear relationship between the voltage gradient and the product of the current and the effective probe spacing.Type: ApplicationFiled: May 5, 2009Publication date: November 12, 2009Applicant: SPECTRUM EXTERNAL LINE INSPECTION TECHNOLOGY INC.Inventors: Shamus McDonnell, Mike Westman, Chijioke Ukiwe