Patents Assigned to Staib Instrumente GmbH
  • Patent number: 6841777
    Abstract: An electron source particularly for a RHEED measurement system or a RHEED measurement system as such includes an electron emitter (5), a first deflection stage (6a, b) for radiating an electron beam onto a sample (1), and a second deflection stage between the first stage (6a, b) and the sample 1, preferably near the sample.
    Type: Grant
    Filed: September 17, 2003
    Date of Patent: January 11, 2005
    Assignee: Staib Instruments GmbH
    Inventor: Philippe Staib
  • Publication number: 20040065844
    Abstract: An electron source particularly for a RHEED measurement system or a RHEED measurement system as such includes an electron emitter (5), a first deflection stage (6a, b) for radiating an electron beam onto a sample (1), and a second deflection stage between the first stage (6a, b) and the sample 1, preferably near the sample.
    Type: Application
    Filed: September 17, 2003
    Publication date: April 8, 2004
    Applicant: Staib Instrumente GmbH
    Inventor: Philippe Staib
  • Patent number: 6492644
    Abstract: A device for imaging a beam of particles composed of charged particles with a certain energy and angle distribution on a detector device using a device, including a deflection unit with at least one deceleration lens provided for forming essentially parallel particle paths in the particle beam, whose reciprocal distances correspond to the angle distribution of the particles, and a filtering unit, which is located between the deflection unit and the detector facility, whereby the filtering unit may be biased with a potential for formation of a braking field and is adapted to be energy-selectively permeable for the particles, on the sample side before the deflection unit, an entry window in the form of an axial-symmetrical staged aperture or an entry grid is located, which is electrically separated from the deflection unit and at ground potential.
    Type: Grant
    Filed: June 21, 2000
    Date of Patent: December 10, 2002
    Assignee: Staib Instrumente GmbH
    Inventor: Philippe Staib
  • Patent number: 6198095
    Abstract: An apparatus and method for imaging on a detector a particle beam of charged particles having a distinct energy distribution and a distinct angle distribution. The apparatus has deflectors which are provided to create in the particle beam essentially parallel particle paths spaced to correspond to their original angle distribution. The deflectors also direct the particle beam to semi-transmissive, aligned filter electrodes, which produce a potential difference to create a deceleration field to allow the particles to pass through by means of energy selectivity.
    Type: Grant
    Filed: January 14, 1998
    Date of Patent: March 6, 2001
    Assignee: Staib Instruments GmbH
    Inventor: Philippe Staib