Abstract: Method for verifying data generated by an electronic device included in equipment, the electronic device including a computing unit, a one-time programmable memory and a volatile memory, the equipment including a rewritable non-volatile memory and a communication bus enabling the electronic device to store data in the rewritable non-volatile memory. The method includes: creating a secured channel by encryption between the equipment and a server; obtaining an authentication key from the server; loading data and a message authentication code from the rewritable non-volatile memory to the volatile memory, the message authentication code obtained by the electronic device from the authentication key and said data prior to the storage of said data and message authentication code in the rewritable non-volatile memory, the electronic device not having kept the authentication key following the obtaining of the message authentication code; verifying said data using the secret key and the message authentication code.

Abstract: A tester for integrated circuits on a silicon wafer includes an input/output connection for testing an integrated circuit. The tester comprises circuitry arranged for transferring a first data frame to the integrated circuit via the input/output connection, the first data frame including a time reference for the data included in the data frame, a field for validating the time reference and a data field including at least one test command and for receiving a second data frame via the input/output connection, the data in the second data frame received having a duration that is a multiple of the time reference.

Abstract: Method for verifying data generated by an electronic device included in equipment, the electronic device including a computing unit, a one-time programmable memory and a volatile memory, the equipment including a rewritable non-volatile memory and a communication bus enabling the electronic device to store data in the rewritable non-volatile memory. The method includes: creating a secured channel by encryption between the equipment and a server; obtaining an authentication key from the server; loading data and a message authentication code from the rewritable non-volatile memory to the volatile memory, the message authentication code obtained by the electronic device from the authentication key and said data prior to the storage of said data and message authentication code in the rewritable non-volatile memory, the electronic device not having kept the authentication key following the obtaining of the message authentication code; verifying said data using the secret key and the message authentication code.

Abstract: The invention concerns an electronic module (2) for a contactless smart card or dual contact and contactless smart card comprising at least a first antenna (3a), a second antenna (3b), a third antenna (3c) and a microelectronic chip (1), characterized in that: said microelectronic chip comprises a microprocessor, at least a first contact (P1), a second contact (P2), a third contact (P3), a fourth contact (P4), a first tuning capacitor (C1) connected between the first contact (P1) and the third contact (P3), a second capacitor (C2) connected between the second contact (P2) and the fourth contact (P4), said first and third contacts (P1, P3) being connected to the inputs/outputs of the microprocessor and being configured to transmit to said microprocessor a radio-frequency communication signal exchanged through the antennas, said first antenna (3a) is connected between the first contact (P1) and the third contact (P3) and is configured to be brought into resonance by said first capacitor (C1), said second ant

Abstract: A tester for integrated circuits on a silicon wafer may include an input/output connection for testing an integrated circuit and circuitry causing the tester to perform: transferring a data frame to the integrated circuit via the input/output connection, the data frame including a time reference for the data included in the data frame, a field for validating the time reference and a data field including at least one integrated-circuit test command; and receiving a data frame via the input/output connection, the data in the data frame received having a duration that is a multiple of the time reference.

Abstract: The invention relates to a method for managing the endurance of a data storage system provided with a set of sectors endowed with a guaranteed native endurance capacity (G), comprising the steps consisting in: —partitioning said data storage system into a plurality of work sectors, and into a plurality of replacement sectors able to form an endurance reservoir, certain of the work sectors being intended to be replaced by replacement sectors when said work sectors are expended after a certain number of programming and/or erasure cycles; —defining an address management area making it possible to retrieve the location of the replacement sectors assigned to expended work sectors; —determining, sector by sector, whether a current work sector is physically expended, and executing a step of replacing this work sector by a replacement sector, only when said current work sector is declared physically expended.