Patents Assigned to Steinbichler Optotechnik GmbH
  • Patent number: 7860297
    Abstract: In a method for detecting the deformation of objects (1), a sequence of pictures of the object (1) is taken with a measurement method during the deformation of the object (1). From the pictures, phase images are determined. To improve such method, there is formed the difference between the current phase image or the respective current phase image and the phase image of an initial state. This difference or these differences is/are evaluated and/or displayed on a visual display unit and/or stored.
    Type: Grant
    Filed: October 17, 2006
    Date of Patent: December 28, 2010
    Assignee: Steinbichler Optotechnik GmbH
    Inventors: Robert Wilhelm, Juni Sun, Rainer Huber, Marcus Steinbichler, Volker Rasenberger
  • Patent number: 7810388
    Abstract: A tire testing facility used for testing tires includes a tire testing device with one or more testing heads (5) for testing the inner running surface (8) of the tire (1) and one or more testing heads (6, 7) for testing the outer sidewall (3, 2) side wall of the tire (1).
    Type: Grant
    Filed: August 6, 2008
    Date of Patent: October 12, 2010
    Assignee: Steinbichler Optotechnik GmbH
    Inventors: Marcus Steinbichler, Rainer Huber, Junil Sun, Bernd Leitner
  • Publication number: 20100239136
    Abstract: A scanner is used for scanning an object, in particular one or more teeth (13, 14, 15) or a dental cast. An improved scanner comprises a carrier (2) on which a plurality of projectors (4) for projecting a pattern onto the object and a plurality of cameras (5) for recording the object are provided one beside the other in an array.
    Type: Application
    Filed: September 16, 2009
    Publication date: September 23, 2010
    Applicant: STEINBICHLER OPTOTECHNIK GMBH
    Inventors: Michael Gandyra, Marcus Steinbichler
  • Patent number: 7801441
    Abstract: A camera comprises a line sensor or an areal sensor (1) and an optical imaging system (2) for the projection of an image onto the sensor (1). To increase the resolution, a displacement device (6) is provided for the displacement of the image relative to the sensor (1) (FIG. 2).
    Type: Grant
    Filed: February 1, 2006
    Date of Patent: September 21, 2010
    Assignee: Steinbichler Optotechnik GmbH
    Inventors: Markus Lazar, Marcus Steinbichler
  • Publication number: 20100149524
    Abstract: The present invention relates to a method and a device for determining the spatial position of a sensor, in which a rough position information initially is determined by rough detection of the position of the sensor, and then the more accurate position of the sensor is obtained by measuring at least three reflectors mounted on the sensor with a laser tracker, wherein the search region of the laser of the laser tracker is limited for the reflectors with reference to the rough position information.
    Type: Application
    Filed: June 11, 2009
    Publication date: June 17, 2010
    Applicant: STEINBICHLER OPTOTECHNIK GMBH
    Inventors: Thomas Mayer, Thomas Nasswetter, Marcus Steinbichler, Andreas Weber
  • Patent number: 7570370
    Abstract: A method serves for the determination of the 3D coordinates of an object (2). A fringe pattern is projected onto the object (2) in the method. The light reflected by the object (2) is recorded and evaluated. To improve such a method, the fringe pattern is projected onto the object (2) by an imaging element (only FIGURE).
    Type: Grant
    Filed: October 11, 2007
    Date of Patent: August 4, 2009
    Assignee: Steinbichler Optotechnik GmbH
    Inventors: Markus Steinbichler, Thomas Mayer, Markus Estermann
  • Publication number: 20090044615
    Abstract: A tire testing facility is used for testing tires. To improve such tire testing facility, the same comprises a tire testing device with one or more testing heads (5) for testing the inner running surface (8) of the tire (1) and one or more testing heads (6, 7) for testing the outer sidewall (3, 2) of the tire (1).
    Type: Application
    Filed: August 6, 2008
    Publication date: February 19, 2009
    Applicant: STEINBICHLER OPTOTECHNIK GMBH
    Inventors: Marcus Steinbichler, Rainer Huber, Junil Sun, Bernd Leitner
  • Patent number: 7456973
    Abstract: The invention serves for the contour measurement and/or deformation measurement of an object, particularly a tire or a structural component of a composite material. The object is irradiated with light, particularly structured light, that is emitted by a radiation source and consists, in particular, of coherent light or partially coherent light, especially laser light. The light reflected by the object is picked up by a camera with an imaging sensor. In order to improve the image quality, a first image is produced with a first adjustment of the camera and/or the radiation source which is adapted to a first image region (13). In addition, a second image is produced with a second adjustment of the camera and/or the radiation source which is adapted to a second image region (12). Both images are combined (FIG. 5).
    Type: Grant
    Filed: April 27, 2004
    Date of Patent: November 25, 2008
    Assignee: Steinbichler Optotechnik GmbH
    Inventors: Hans Steinbichler, Roman Berger, Thomas Mayer
  • Patent number: 7436522
    Abstract: A method serves to determine the 3D coordinates of an object. The 3D coordinates of a partial surface (6) of the object are determined by a 3D measuring device (3), which includes one or more detectors (4) and whose position is determined by a tracking system. The 3D coordinates of an adjacent partial surface (7) of the object are determined by the 3D measuring device (3). The 3D coordinates of an overlap region of he adjacent partial surfaces (6,7) are put together by a matching method. In doing so, an error function is determined and minimized iteratively. Furthermore, the error function of a detector (4) of the 3D measuring device (3) is determined.
    Type: Grant
    Filed: May 18, 2006
    Date of Patent: October 14, 2008
    Assignee: Steinbichler Optotechnik GmbH
    Inventors: Marcus Steinbichler, Armin Maidhof, Matthias Prams, Makus Leitner
  • Patent number: 7414732
    Abstract: The invention relates to a method for determining the 3D profile of an object. In order to improve a method of this type, several sections of the object (5) are measured. During at least one measuring operation, at least one reference object (4) is measured. The measured sections of the object (5) are combined (1).
    Type: Grant
    Filed: May 16, 2001
    Date of Patent: August 19, 2008
    Assignee: Steinbichler Optotechnik GmbH
    Inventors: Armin Maidhof, Peter Andrā, Manfred Adlhart, Michael Kaus, Markus Basel, Frank Thoss, Markus Lazar, Thomas Nasswetter, Hans Steinbichler
  • Patent number: 7360410
    Abstract: A procedure serves for the testing of tires by means of a testing system. The testing system includes a memory in which geometric data (1, 2, 3, 4, 5, 6) of the tire (7) are stored, and at least one probe (8) for testing the tire (7) surface. To improve on such a device, the probe or probes (8) are positioned with due consideration for the geometric data (1-6) of the tire (7) for the testing of the tire (7) surface (FIG. 1).
    Type: Grant
    Filed: July 26, 2004
    Date of Patent: April 22, 2008
    Assignee: Steinbichler Optotechnik GmbH
    Inventors: Hans Steinbichler, Robert Wilhelm, Bernd Leitner, Roman Berger, Volker Rasenberger, Rainer Huber
  • Patent number: 7260983
    Abstract: An apparatus for the inspection of the surface (1) of a tire (2) or the like comprises a projector (3) for the projection of a pattern onto the tire (2) and a camera (4) for the taking of an image of the pattern projected onto the tire. A simplified apparatus of this type comprises an apparatus for the rotation of the tire (2) about its axis (5).
    Type: Grant
    Filed: September 2, 2005
    Date of Patent: August 28, 2007
    Assignee: Steinbichler Optotechnik GmbH
    Inventors: Ernst-Heinrich Nösekabel, Hans Steinbichler, Marcus Steinbichler
  • Publication number: 20060265177
    Abstract: A method serves to determine the 3D coordinates of an object. The 3D coordinates of a partial surface (6) of the object are determined by a 3D measuring device (3), which includes one or more detectors (4) and whose position is determined by a tracking system. The 3D coordinates of an adjacent partial surface (7) of the object are determined by the 3D measuring device (3). The 3D coordinates of an overlap region of the adjacent partial surfaces (6, 7) are put together by a matching method. In doing so, an error function is determined and minimized iteratively. Furthermore, the error function of a detector (4) of the 3D measuring device (3) is determined.
    Type: Application
    Filed: May 18, 2006
    Publication date: November 23, 2006
    Applicant: Steinbichler Optotechnik GmbH
    Inventors: Marcus Steinbichler, Armin Maidhof, Matthias Prams, Markus Leitner
  • Patent number: 6924888
    Abstract: A process serves to record the deformation of objects (1). In order to facilitate reliable evaluation even in the case of relatively large deformations, during the deformation of the object (1) a sequence or series of images of the object is recorded with a measuring process. The differential between two sequential images is formed. These differentials are integrated (FIG. 1).
    Type: Grant
    Filed: November 28, 2001
    Date of Patent: August 2, 2005
    Assignee: Steinbichler Optotechnik GmbH
    Inventors: Hans Steinbichler, Volker Rasenberger, Rainer Huber, Roman Berger
  • Patent number: 6876458
    Abstract: In a method for determining the absolute coordinates of an object (1), the object (1) is exposed to light (3) through a projection grid (2). The light (4) reflected by the object 1 is registered by a sensor (5). The image picked up by the sensor is evaluated. In order to improve such a method, the projection grid (2) comprises a first grid with a first grid vector (G1), and a second grid with a second grid vector (G2) which differs from said first grid vector. The sensor (5) is arranged at a distance (b) from the projection grid (2) such that the projections (bx, by), of the base vector (b) leading from the first and from the second grids to the sensor (5), onto the associated grid vectors (G1, G2) differ in size.
    Type: Grant
    Filed: March 19, 2003
    Date of Patent: April 5, 2005
    Assignee: Steinbichler Optotechnik GmbH
    Inventor: Anton Kraus
  • Patent number: 6840097
    Abstract: The present invention relates to an inspection apparatus for tires having a positioning device for the tire to be inspected and a laser inspection device. In accordance with the invention, the inspection device comprises several measuring heads, in particular laser measuring heads in order to reduce the inspection time. In accordance with one aspect of the invention, several observation units and associated lighting sources are integrated in each measuring head.
    Type: Grant
    Filed: April 10, 2000
    Date of Patent: January 11, 2005
    Assignee: Steinbichler Optotechnik GmbH
    Inventors: Rainer Huber, Bernd Leitner, Hans Steinbichler, Junli Sun, Volker Rasenberger, Thomas Köhler, Thomas Leitner, Josef Engelsberger
  • Publication number: 20040212795
    Abstract: The invention serves for the contour measurement and/or deformation measurement of an object, particularly a tire or a structural component of a composite material. The object is irradiated with light, particularly structured light, that is emitted by a radiation source and consists, in particular, of coherent light or partially coherent light, especially laser light. The light reflected by the object is picked up by a camera with an imaging sensor. In order to improve the image quality, a first image is produced with a first adjustment of the camera and/or the radiation source which is adapted to a first image region (13). In addition, a second image is produced with a second adjustment of the camera and/or the radiation source which is adapted to a second image region (12). Both images are combined (FIG. 5).
    Type: Application
    Filed: April 27, 2004
    Publication date: October 28, 2004
    Applicant: Steinbichler Optotechnik GmbH
    Inventors: Hans Steinbichler, Roman Berger, Thomas Mayer
  • Patent number: 6741363
    Abstract: A method is provided for the optical detection of a contrast line in which the area or spatial coordinates of the contrast line are detected, with the detection being performed by a scanner, preferably a laser scanner, which scans the contrast line in a linear manner. An apparatus is also provided for the optical detection of a contrast line having a laser diode, a deflection apparatus for the deflection of the laser beam emitted from the laser diode and having a detector for the detection of the reflected beams, with the deflection apparatus being designed movably such that the laser beam emitted from the laser diode can be shifted in parallel by an amount depending upon position of the deflection apparatus and where the spatial coordinates of the contrast line can be detected by analyzing the beams detected by the detector.
    Type: Grant
    Filed: December 1, 1999
    Date of Patent: May 25, 2004
    Assignee: Steinbichler Optotechnik GmbH
    Inventor: Bertram Kaupert
  • Patent number: 6590668
    Abstract: A method serves the direct phase-angle measurement of radiation, in particular of light radiation which is reflected from a body. The body is exposed to coherent radiation. The radiation reflected from the body is imaged by an imaging optical system (6) in an image plane in which a sensor is located. A reference radiation generated in accordance with the shearing method is superimposed on the sensor. The phase of the radiation from the body is determined from the measurement signals of the sensor. To improve such a method, the imaging optical system (6) possesses a diaphragm (11) having one or two apertures (12, 13) (FIG. 2a).
    Type: Grant
    Filed: December 7, 1999
    Date of Patent: July 8, 2003
    Assignee: Steinbichler Optotechnik GmbH
    Inventors: Rainer Huber, Junli Sun, Bernd Leitner, Hans Steinbichler