Abstract: An optical monitoring system comprising first and second sensor arrays interrogated via first and second optical connections from an interrogator location. The system is configured such that no wavelength is carried bi-directionally in the first and second optical connections. In typical systems the optical connections comprise trunk cables from the sensor arrays to the interrogator location.
Type:
Grant
Filed:
July 4, 2013
Date of Patent:
August 8, 2017
Assignee:
STINGRAY GEOPHYSICAL INC.
Inventors:
Edward Alfred Denzil Austin, Philip Nash