Patents Assigned to STMicroelectronics Design & Application sro
  • Publication number: 20120087052
    Abstract: A method comprising: a) during at least part of a conduction phase of the triac, measuring the gate potential of the triac; and b) comparing a value based on said measurement with a reference threshold and deducing the presence or the absence of an overcurrent based on said comparison.
    Type: Application
    Filed: September 23, 2011
    Publication date: April 12, 2012
    Applicants: STMicroelectronics Design & Application sro, STMicroelectronics (Tours) SAS
    Inventors: Jan Dreser, Laurent Gonthier