Abstract: A method comprising: a) during at least part of a conduction phase of the triac, measuring the gate potential of the triac; and b) comparing a value based on said measurement with a reference threshold and deducing the presence or the absence of an overcurrent based on said comparison.
Type:
Application
Filed:
September 23, 2011
Publication date:
April 12, 2012
Applicants:
STMicroelectronics Design & Application sro, STMicroelectronics (Tours) SAS