Abstract: Testing of control wires of a pixel array of an image sensor is performed by applying a signal transition to a control wire and detecting, based on a voltage signal detected on the control wire, the duration of at least part of the signal transition on the control wire. An electrical fault in the control wire is indicated based on a comparison of the detected duration to a threshold.
Type:
Grant
Filed:
October 20, 2015
Date of Patent:
November 19, 2019
Assignee:
STMicroelectronics (Grenoble 2) SA
Inventors:
Richun Fei, Salvador Mir, Jocelyn Moreau
Abstract: An integrated circuit (IC) cell may include first and second semiconductor regions, and parallel electrically conductive lines extending above the first and second semiconductor regions. The IC cell may further include electrically conductive line contacts electrically connected to the parallel electrically conductive lines, and may include at least one first line contact between the first semiconductor region and a corresponding end of the IC cell, and at least one second line contact between the first semiconductor region and the second semiconductor region. Adjacent ones of the electrically conductive lines may be respectively coupled to one of the at least one first line contact and to one of the at least one second line contact.
Type:
Application
Filed:
September 21, 2011
Publication date:
May 31, 2012
Applicants:
STMicroelectronics STM, STMicroelectronics (Grenoble 2) SA