Abstract: This disclosure provides photonic integrated chip that has an optical waveguide located on a photonic circuit substrate that includes a photonic circuit that is optically coupled to the waveguide. A microfluidic channel is in a silicon substrate and is attached to the photonic circuit substrate. The microfluidic channel is positioned over the optical waveguide such that its side surfaces and an outermost surface extend into the microfluidic channel. The microfluidic channel extends along a length of the optical waveguide, and nanoparticles are located on or adjacent the optical waveguide located within the microfluidic channel.

Abstract: This disclosure presents a docking station into which a test card can be inserted for rapid analyte detection and reporting. This docking station has portable capability and can include wire or wireless transmission to a local server or cloud-based server. A test card that has a test structure located on the test structure that includes a modified waveguide can be inserted into the and a docking station that includes a laser and interferometer provides for accurate and rapid detection of a test sample.

Abstract: This disclosure provides photonic integrated chip that has an optical waveguide located on a photonic circuit substrate that includes a photonic circuit that is optically coupled to the waveguide. A microfluidic channel is in a silicon substrate and is attached to the photonic circuit substrate. The microfluidic channel is positioned over the optical waveguide such that its side surfaces and an outermost surface extend into the microfluidic channel. The microfluidic channel extends along a length of the optical waveguide, and nanoparticles are located on or adjacent the optical waveguide located within the microfluidic channel.

Abstract: This disclosure presents a docking station into which a test card can be inserted for rapid analyte detection and reporting. This docking station has portable capability and can include wire or wireless transmission to a local server or cloud-based server. A test card that has a test structure located on the test structure that includes a modified waveguide can be inserted into the and a docking station that includes a laser and interferometer provides for accurate and rapid detection of a test sample.