Abstract: Incoherent millimeter wave, sub-millimeter wave and terahertz test signals are used to probe metal substrates that are covered by a protective coating or outer layer, such as paint or thermal insulation, obscuring direct assessment of the substrate. The incoherent test signals, which may be from a naturally occurring passive source (such as the sky) and/or from an active noise source, provide signal dispersion and angular variation of the test signals with respect to angular incidence to the substrate. Illumination of the substrate permits differentiation between un-corroded and corroded sections of the sample because reflectivity (and emissivity) from a metal-based substrate is heavily dependent on the surface resistivity which in turn is dependent on the corroded state.
Type:
Grant
Filed:
September 23, 2013
Date of Patent:
December 13, 2016
Assignee:
Subterrandt Limited
Inventors:
Christopher Mark Mann, Joseph Peter Dunne