Abstract: An integrated circuit and a method of protection of an integrated circuit provides for a test controller state machine (TCSM) to be coupled to a control structure and/or an input and/or an output of at least one data storage device of the integrated circuit. The TCSM monitors the state of the data storage device and, upon a test request to the integrated circuit, causes the information in the data storage device to be changed or blocked until the data storage device is deemed safe for access. Such an integrated circuit and method protects information contained in data storage devices of the integrated circuit from being revealed during testing of circuitry of the integrated circuit.