Patents Assigned to Supriya Jaiswal
  • Patent number: 10519495
    Abstract: Methods, apparatus, and processes which use Extreme ultraviolet radiation (EUV) and/or soft X-ray wavelengths to read, image, edit, locate, identify, map, alter, delete, repair and sequence genes are described. An EUV scanning tool which allows high throughput genomic scanning of DNA, RNA and protein sequences is also described. A database which records characteristic absorption spectra of gene sequences is also described.
    Type: Grant
    Filed: February 1, 2017
    Date of Patent: December 31, 2019
    Assignee: Supriya Jaiswal
    Inventor: Supriya Jaiswal